Add to ORKGThe systematization of the method of simulation effects applied to individual forecasting gradual failures of electronic equipment is carried out. The method used to develop a method for predicting gradual failures of bipolar transistors. It allows the reaction of the functional parameter specific instance (transistor) on the impact of simulation at the initial time to predict the value for a given future developments and decide on the reliability of this instance of the phase-out of use for this
This paper describes a new method for the analysis and optimization of reliability as an integrated ...
This paper describes the outcome of a study into the feasibility of a reliability circuit simulator ...
For semiconductor devices of high power, the authors experimentally obtained of models of functional...
Individual forecasting of the reliability of semiconductor devices, taking into account gradual fail...
In individual forecasting of parameter values and, therefore, gradual refuses of electronic devices'...
When assembling electronic complexes for medical purposes, it is important to install highly reliabl...
The method of obtaining the model, describing degradation regularity for function parameter of elect...
The paper presents the developed simulation model enabling the evaluation of the reliability of tech...
The authors suggest a method of the reliability prediction for electronic devices, considering possi...
With the help of accelerated tests we have obtained experimental data about the degradation of the f...
AbstractAt present, customers demand more complex and reliable products to be developed with shorter...
Reliability prediction of the electronic components used in industrial safety systems requires high ...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
This paper describes a prognostic method which combines the physics of failure models with probabili...
This thesis presents a new technique for simulating integrated circuits, called probabilistic simula...
This paper describes a new method for the analysis and optimization of reliability as an integrated ...
This paper describes the outcome of a study into the feasibility of a reliability circuit simulator ...
For semiconductor devices of high power, the authors experimentally obtained of models of functional...
Individual forecasting of the reliability of semiconductor devices, taking into account gradual fail...
In individual forecasting of parameter values and, therefore, gradual refuses of electronic devices'...
When assembling electronic complexes for medical purposes, it is important to install highly reliabl...
The method of obtaining the model, describing degradation regularity for function parameter of elect...
The paper presents the developed simulation model enabling the evaluation of the reliability of tech...
The authors suggest a method of the reliability prediction for electronic devices, considering possi...
With the help of accelerated tests we have obtained experimental data about the degradation of the f...
AbstractAt present, customers demand more complex and reliable products to be developed with shorter...
Reliability prediction of the electronic components used in industrial safety systems requires high ...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
This paper describes a prognostic method which combines the physics of failure models with probabili...
This thesis presents a new technique for simulating integrated circuits, called probabilistic simula...
This paper describes a new method for the analysis and optimization of reliability as an integrated ...
This paper describes the outcome of a study into the feasibility of a reliability circuit simulator ...
For semiconductor devices of high power, the authors experimentally obtained of models of functional...