In this paper, the effect of applying dc voltage and dc current sources in using the potentiometric method on the accuracy and the uncertainty of the resistance measurements is studied. This study is done practically for the low and high values of standard resistance ranges from 100 to 10 MΩ. The traceability chain for the used resistors is introduced by using the standard resistors 1 Ω Thomas type, 10 kΩ model SR104, and four Hamon transfer standards. The system operation is remotely controlled by using a LabVIEW program to improve the performance. The measurement results and the uncertainty estimation values are discussed to identify the effect of the applied voltage and current on the different resistance ranges measurement
The paper presents an original methodology for testing the data acquisition system immunity to condu...
This book covers the basic theory of electrical circuits, describes analog and digital instrumentati...
This work establishes the level of uncertainty for electrical measurements commonly made on thermoel...
Many devices have components that have very low ohmic properties. The resistances of these component...
A traceable to dc Resistance and dc Voltage National Standards measurement technique to calibrate dc...
666-673In the present paper, calibration of precision DC high current source (> 2 A and up to 100 A)...
Abstract- Primary electromagnetic laboratory in Zagreb maintains standards of four major electromagn...
This paper describes a measurement method developed at National Institute of metrological Research (...
A National inter-laboratories comparison of dc resistance at 100 GΩ and 1 TΩ among the National Inst...
Abstract Zero‐sequence currents in high‐voltage power systems during normal operation can have a sig...
The paper presents an original methodology for testing the data acquisition system immunity to condu...
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses ...
A potentiometric measurement system used to compare the quantised Hall resistance with a nominally e...
Abstract- In this paper there are analysed parameters of typical sources that are used for power sup...
Calibration is important in microwave power sensor measurement, since it can improve the overall acc...
The paper presents an original methodology for testing the data acquisition system immunity to condu...
This book covers the basic theory of electrical circuits, describes analog and digital instrumentati...
This work establishes the level of uncertainty for electrical measurements commonly made on thermoel...
Many devices have components that have very low ohmic properties. The resistances of these component...
A traceable to dc Resistance and dc Voltage National Standards measurement technique to calibrate dc...
666-673In the present paper, calibration of precision DC high current source (> 2 A and up to 100 A)...
Abstract- Primary electromagnetic laboratory in Zagreb maintains standards of four major electromagn...
This paper describes a measurement method developed at National Institute of metrological Research (...
A National inter-laboratories comparison of dc resistance at 100 GΩ and 1 TΩ among the National Inst...
Abstract Zero‐sequence currents in high‐voltage power systems during normal operation can have a sig...
The paper presents an original methodology for testing the data acquisition system immunity to condu...
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses ...
A potentiometric measurement system used to compare the quantised Hall resistance with a nominally e...
Abstract- In this paper there are analysed parameters of typical sources that are used for power sup...
Calibration is important in microwave power sensor measurement, since it can improve the overall acc...
The paper presents an original methodology for testing the data acquisition system immunity to condu...
This book covers the basic theory of electrical circuits, describes analog and digital instrumentati...
This work establishes the level of uncertainty for electrical measurements commonly made on thermoel...