Induced currents in silicon pixel detectors of different geometries were simulated. The general properties of charge collection in irradiated segmented devices were investigated. A significant difference in charge collection efficiency (CCE) between n**+-n and p **+-n detectors was predicted after irradiation to the LHC fluences. A possible use of silicon detectors for the LHC upgrade was investigated by simulation of thin pixel sensors. The reduced CCE due to charge trapping seems to be the largest obstacle for their use
We show that doubly peaked electric fields are necessary to describe grazing-angle charge collection...
The charge collection efficiency (CCE) for heavily irradiated silicon devices has been carefully inv...
A simulation of signals in silicon microstrip detectors ($p^+-n-n^+$) has been written. Electron-hol...
During the scheduled high luminosity upgrade of LHC, the world's largest particle physics accelerato...
In this paper we discuss the measurement of charge collection in irradiated silicon pixel sensors an...
In this paper, we discuss the measurement of charge collection in irradiated silicon pixel sensors a...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
At the LHC silicon vertex detectors will be exposed to hadron fluences of the order of . In order to...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN Hi...
The Transient Current Technique (TCT) is used to measure pulse shapes of charge collection and to de...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
We show that doubly peaked electric fields are necessary to describe grazing-angle charge collection...
The charge collection efficiency (CCE) for heavily irradiated silicon devices has been carefully inv...
A simulation of signals in silicon microstrip detectors ($p^+-n-n^+$) has been written. Electron-hol...
During the scheduled high luminosity upgrade of LHC, the world's largest particle physics accelerato...
In this paper we discuss the measurement of charge collection in irradiated silicon pixel sensors an...
In this paper, we discuss the measurement of charge collection in irradiated silicon pixel sensors a...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
At the LHC silicon vertex detectors will be exposed to hadron fluences of the order of . In order to...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN Hi...
The Transient Current Technique (TCT) is used to measure pulse shapes of charge collection and to de...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-L...
We show that doubly peaked electric fields are necessary to describe grazing-angle charge collection...
The charge collection efficiency (CCE) for heavily irradiated silicon devices has been carefully inv...
A simulation of signals in silicon microstrip detectors ($p^+-n-n^+$) has been written. Electron-hol...