Add to ORKGThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.Includes bibliographical references (leaves 24-25).by Mayank T. Bulsara.M.S
[[abstract]]A technique that provides a first approximation to the mean, sigma(0), and gradient, sig...
With the measured geometry morphologies of telephone cord blisters (TCBs), that is, the local bliste...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
An examination of load deflection (bulge) testing of coated and uncoated membranes by analytical and...
This study shows a methodology to estimate mechanical parameters of thin films by means of a bulge t...
Un nouvel essai mécanique a été développé pour répondre à la demande d'analyse des propriétés mécani...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Civil Engineering, 1990.Includes bi...
The aim of the study is the determination of the mechanical properties of thin films by optical metr...
Journal ArticleA wafer scale bulge testing system has been constructed to study the mechanical prope...
Thin films are used for a variety of applications, which can include electronic devices, optical coa...
abstract: Ordered buckling of stiff films on elastomeric substrates has many applications in the fie...
The design of reliable micro electro-mechanical systems (MEMS) requires understanding of material pr...
The entire dissertation/thesis text is included in the research.pdf file; the official abstract appe...
A new technique for measurement of tensile stress in thin films is described. Motivated by the need ...
This thesis is to characterize the thin membrane adhesion-delamination phenomena which occur in biol...
[[abstract]]A technique that provides a first approximation to the mean, sigma(0), and gradient, sig...
With the measured geometry morphologies of telephone cord blisters (TCBs), that is, the local bliste...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
An examination of load deflection (bulge) testing of coated and uncoated membranes by analytical and...
This study shows a methodology to estimate mechanical parameters of thin films by means of a bulge t...
Un nouvel essai mécanique a été développé pour répondre à la demande d'analyse des propriétés mécani...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Civil Engineering, 1990.Includes bi...
The aim of the study is the determination of the mechanical properties of thin films by optical metr...
Journal ArticleA wafer scale bulge testing system has been constructed to study the mechanical prope...
Thin films are used for a variety of applications, which can include electronic devices, optical coa...
abstract: Ordered buckling of stiff films on elastomeric substrates has many applications in the fie...
The design of reliable micro electro-mechanical systems (MEMS) requires understanding of material pr...
The entire dissertation/thesis text is included in the research.pdf file; the official abstract appe...
A new technique for measurement of tensile stress in thin films is described. Motivated by the need ...
This thesis is to characterize the thin membrane adhesion-delamination phenomena which occur in biol...
[[abstract]]A technique that provides a first approximation to the mean, sigma(0), and gradient, sig...
With the measured geometry morphologies of telephone cord blisters (TCBs), that is, the local bliste...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...