Add to ORKGThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.Includes bibliographical references (leaves 33-35).by Clara Sánchez.M.Eng
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
Built in self testing (BIST) is most attractive technique to test different kind of circuits. In BIS...
[[abstract]]During built-in self-test (BIST), the set of patterns generated by a pseudo-random patte...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
A viable technique [7] in built-in self-test (BIST)[2] is to generate test patterns pseudo-exhaustiv...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
With a great growing use of electronic products in many aspects of society, it is evident that these...
This paper proposes low power pseudo random Test Pattern generation .This test pattern is run on the...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be us...
This thesis proposes a novel method for implementing test pattern generators for Built-In Self Test ...
Particularly, several hybrid BIST schemes store deterministic top-up patterns around the tester insi...
During pseudorandom testing, a significant amount of energy and test application time is wasted for ...
This paper explores the design of efficient test sets and test-pattern generators for on-line BIST. ...
ABSTRACT: The fault coverage and hardware over head of a circuit is an important problem in VLSI cir...
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
Built in self testing (BIST) is most attractive technique to test different kind of circuits. In BIS...
[[abstract]]During built-in self-test (BIST), the set of patterns generated by a pseudo-random patte...
Multiple test patterns varying in a single bit position is generated for built-in-self-test (BIST). ...
A viable technique [7] in built-in self-test (BIST)[2] is to generate test patterns pseudo-exhaustiv...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
With a great growing use of electronic products in many aspects of society, it is evident that these...
This paper proposes low power pseudo random Test Pattern generation .This test pattern is run on the...
A new testing paradigm called Built-In Self-Test (BIST) has been gaining increasing acceptance over ...
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be us...
This thesis proposes a novel method for implementing test pattern generators for Built-In Self Test ...
Particularly, several hybrid BIST schemes store deterministic top-up patterns around the tester insi...
During pseudorandom testing, a significant amount of energy and test application time is wasted for ...
This paper explores the design of efficient test sets and test-pattern generators for on-line BIST. ...
ABSTRACT: The fault coverage and hardware over head of a circuit is an important problem in VLSI cir...
The test pattern generator produces test vectors that are applied to the tested circuit during pseud...
Built in self testing (BIST) is most attractive technique to test different kind of circuits. In BIS...
[[abstract]]During built-in self-test (BIST), the set of patterns generated by a pseudo-random patte...