Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.Includes bibliographical references (p. 195-204).by Syed Mohiul Alam.Ph.D
Under similar test conditions, the electromigration reliability of Al and Cu metallization interconn...
In the electronics industry, interconnect is defined as a conductive connection between two or more ...
170 p.With changing materials systems and interconnect architectures from Al based metallization to ...
Supervised by Donald E. Troxel and Carl V. Thompson.Also issued as Thesis (S.M.)--Massachusetts Inst...
The stringent performance and reliability demands that will accompany the development of next-genera...
Contains reports on three research projects.Defense Advanced Research Projects Agency DABT 63-95-C-0...
Thesis (Ph.D.)-University of Natal, Durban, 1988.This thesis proposes a new approach to the design o...
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 19...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
Dissertation made openly available per email from author, 1/5/2017Ph.D.Abhijit Chatterje
textThe function of an interconnect system is to distribute signals and power to various circuits i...
er so na l co py Microelectronics Journal 38 (2007) 463–473 Reliability computer-aided design tool f...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, ...
Under similar test conditions, the electromigration reliability of Al and Cu metallization interconn...
In the electronics industry, interconnect is defined as a conductive connection between two or more ...
170 p.With changing materials systems and interconnect architectures from Al based metallization to ...
Supervised by Donald E. Troxel and Carl V. Thompson.Also issued as Thesis (S.M.)--Massachusetts Inst...
The stringent performance and reliability demands that will accompany the development of next-genera...
Contains reports on three research projects.Defense Advanced Research Projects Agency DABT 63-95-C-0...
Thesis (Ph.D.)-University of Natal, Durban, 1988.This thesis proposes a new approach to the design o...
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 19...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
Dissertation made openly available per email from author, 1/5/2017Ph.D.Abhijit Chatterje
textThe function of an interconnect system is to distribute signals and power to various circuits i...
er so na l co py Microelectronics Journal 38 (2007) 463–473 Reliability computer-aided design tool f...
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer S...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, ...
Under similar test conditions, the electromigration reliability of Al and Cu metallization interconn...
In the electronics industry, interconnect is defined as a conductive connection between two or more ...
170 p.With changing materials systems and interconnect architectures from Al based metallization to ...