All correspondence concerning this article should be addressed to Prof. John WyattThis paper proposes three tests to determine whether a given nonlinear device noise model is in agreement with accepted thermodynamic principles. These tests are applied to several models. One conclusion is that every Gaussian noise model for any nonlinear device predicts thermodynamically impossible circuit behavior: these models should be abandoned. But the nonlinear shot-noise model predicts thermodynamically acceptable behavior under a constraint derived here. Further, this constraint specifies the current noise amplitude at each operating point from knowledge of the device v - i curve alone. For the Gaussian and shot-noise models, this paper show...
In the development of a nonlinear transistor model, several measurements are used to extract equival...
A technology-independent, inherently nonlinear approach is proposed for the compact modelling of hig...
Dynamic range is an important metric that specifies the limits of input signal amplitude for the ide...
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer ...
: The first result of this paper gives the shot-noise amplitude for a class of nonlinear resistances...
This paper considers a connection between the deterministic and noisy behavior of nonlinear network...
Contains research objectives and reports on two research projects.Lincoln Laboratory (Purchase Order...
In this paper a new approach of thermal noise analysis of electronic oscillators is presented. Altho...
This thesis presents a comprehensive investigation of noise and thermodynamics in electronic circuit...
We provide a general theory of nonlinear electronic circuits subjected to thermal noise. The devices...
An extension of fluctuation–dissipation theorem is used to derive a “speed limit” theorem for nonlin...
This paper shows that today’s modelling of electrical noise as coming from noisy resistances is a no...
"October, 1982."Bibliography: p. 16-17.National Science Foundation Grant No. ECS 800 6878by John L. ...
The error probability at a node of a digital circuit exposed to thermal noise agitation is investiga...
Nonlinearity in many systems is heavily dependent on component variation and environmental factors s...
In the development of a nonlinear transistor model, several measurements are used to extract equival...
A technology-independent, inherently nonlinear approach is proposed for the compact modelling of hig...
Dynamic range is an important metric that specifies the limits of input signal amplitude for the ide...
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer ...
: The first result of this paper gives the shot-noise amplitude for a class of nonlinear resistances...
This paper considers a connection between the deterministic and noisy behavior of nonlinear network...
Contains research objectives and reports on two research projects.Lincoln Laboratory (Purchase Order...
In this paper a new approach of thermal noise analysis of electronic oscillators is presented. Altho...
This thesis presents a comprehensive investigation of noise and thermodynamics in electronic circuit...
We provide a general theory of nonlinear electronic circuits subjected to thermal noise. The devices...
An extension of fluctuation–dissipation theorem is used to derive a “speed limit” theorem for nonlin...
This paper shows that today’s modelling of electrical noise as coming from noisy resistances is a no...
"October, 1982."Bibliography: p. 16-17.National Science Foundation Grant No. ECS 800 6878by John L. ...
The error probability at a node of a digital circuit exposed to thermal noise agitation is investiga...
Nonlinearity in many systems is heavily dependent on component variation and environmental factors s...
In the development of a nonlinear transistor model, several measurements are used to extract equival...
A technology-independent, inherently nonlinear approach is proposed for the compact modelling of hig...
Dynamic range is an important metric that specifies the limits of input signal amplitude for the ide...