Electrostatic force microscopy (EFM) represents a versitile tool for the characterisation of electric and dielectric structures at nanoscale which can be employed to provide charge distributions associated with such nanotopologies. EFM-phase profiles show only the variation of electrostatic force which is strongly influenced by the surface conductivity of nanostructured arrays providing improved definition compared to conventional AFM. Here we apply it to carbon nanochannel arrays embedded within polyimide dielectric matrices. Copyright © 2012 World Scientific Publishing Co. All rights reserve
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
We investigate the dependency of electrostatic interaction forces on applied potentials in electrost...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The unusual properties of nanocomposites are commonly explained by the structure of their interphase...
Electrostatic force microscopy has been used to study the electrostatic force on a nanometer length ...
Several electrostatic force microscopy (EFM) - based methods have been recently developed to study t...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
The study of a surface\u2019s electrical properties at very small scales with scanning probe microsc...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
It is difficult to imagine a more flexible platform for nanoscale instrumentation design than the mo...
[EN] Phase-mode electrostatic force microscopy (EFM-Phase) is aviable technique to image surface ele...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
We investigate the dependency of electrostatic interaction forces on applied potentials in electrost...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The unusual properties of nanocomposites are commonly explained by the structure of their interphase...
Electrostatic force microscopy has been used to study the electrostatic force on a nanometer length ...
Several electrostatic force microscopy (EFM) - based methods have been recently developed to study t...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
International audienceAtomic force microscopy (AFM) and related electrical probe techniques such as ...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
The study of a surface\u2019s electrical properties at very small scales with scanning probe microsc...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
It is difficult to imagine a more flexible platform for nanoscale instrumentation design than the mo...
[EN] Phase-mode electrostatic force microscopy (EFM-Phase) is aviable technique to image surface ele...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
We investigate the dependency of electrostatic interaction forces on applied potentials in electrost...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...