State of the proton induced x-ray emission (PIXE) work at Lucas Heights is reported together with a full description of the experimental arrangement and its use for analysis of trace elements (Z > 14). The fundamentals of PIXE are examined in detail with a view to understanding not only the background continuum but also the x-ray production mechanisms. Quantitative predictions for the number of x-rays detected after proton bombardment of the target have been made and these compare well with experiments
In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination ...
National audienceParticle Induced X-ray Emission (PIXE) high-energy ion beam analysis allows for non...
Comparisons between the thin and thick target methods of measuring proton-induced K X-ray production...
A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed ...
The basic principles, instrumentation, sample types, and applications of the particle-induced X-ray ...
The present work describes the development of a proton induced X-ray emission (PIXE) analysis system...
The capabilities of the equipment for proton induced X-ray emission analysis at the University of Su...
The study conducted in this thesis work aimed to understand and assess some of the main aspects invo...
Quantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV ...
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emis...
The accelerator based ion beam technique of Particle Induced X-ray Emission (PIXE) is discussed in ...
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which...
Abstract in UndeterminedIn 1970, it was shown experimentally by Johansson et al. that the excitation...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX86788 / BLDSC - British Library Do...
Proton-Induced X-ray emission analysis (PIXE) constitutes a method for trace element analysis charac...
In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination ...
National audienceParticle Induced X-ray Emission (PIXE) high-energy ion beam analysis allows for non...
Comparisons between the thin and thick target methods of measuring proton-induced K X-ray production...
A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed ...
The basic principles, instrumentation, sample types, and applications of the particle-induced X-ray ...
The present work describes the development of a proton induced X-ray emission (PIXE) analysis system...
The capabilities of the equipment for proton induced X-ray emission analysis at the University of Su...
The study conducted in this thesis work aimed to understand and assess some of the main aspects invo...
Quantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV ...
Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emis...
The accelerator based ion beam technique of Particle Induced X-ray Emission (PIXE) is discussed in ...
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which...
Abstract in UndeterminedIn 1970, it was shown experimentally by Johansson et al. that the excitation...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX86788 / BLDSC - British Library Do...
Proton-Induced X-ray emission analysis (PIXE) constitutes a method for trace element analysis charac...
In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination ...
National audienceParticle Induced X-ray Emission (PIXE) high-energy ion beam analysis allows for non...
Comparisons between the thin and thick target methods of measuring proton-induced K X-ray production...