Characterizing the carrier-envelope offset in an optical frequency comb without traditional <i>f</i>-to-2<i>f</i> interferometry

We present a new method to measure the frequency noise and modulation response of the carrier-envelope offset (CEO) beat of an optical frequency comb that does not make use of the traditional f-to-2f interferometry. Instead, we use an appropriate combination of different signals to extract the contribution of the CEO frequency without directly detecting it. We present a proof-of-principle validation realized with a commercial Er:fiber frequency comb and show an excellent agreement with the results obtained using a standard f-to-2f interferometer. This approach is attractive for the characterization of novel frequency comb technologies for which self-referencing is challenging, such as semiconductor mode-locked lasers, microresonator-based systems, or GHz repetition rate lasers