This paper outlines the use of the network analyzer to measure the dielectric properties of materials over a broad frequency range. The method described here is based on transmission techniques with simple procedures for obtaining initial estimates and unambiguous solutions for the dielectric parameters. A further feature is that this measurement technique provides a degree of self-checking for inconsistent results
The authors present a new transmission line method for measuring the complex permittivity of dielect...
Millimeter wave technologies have widespread applications, for which dielectric permittivity is a fu...
A material’s dielectric properties are determined by its molecular structure, other properties of in...
By employment of state-of-the-art Vector Network Analyzers, and other wide-band measurement equipmen...
In this research paper, we propose a simple procedure for accurate, stable and broadband measurement...
Modified free space method using a vector network analyzer is proposed. The algorithm for determinin...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
It is a commonly held belief that broadband permittivity measurement techniques have great uncertain...
Two methods for measuring the dielectric constant and loss tangent of the dielectric materials using...
The work of this article is a contribution to the characterization of new materials at microwave fre...
This paper presents a fast and easy to use method to determine permittivity and loss tangent in the ...
This paper presents a broadband material characterization method applicable to measure the complex d...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
This paper presents a broadband material characterization method applicable to measure the complex d...
The authors present a new transmission line method for measuring the complex permittivity of dielect...
Millimeter wave technologies have widespread applications, for which dielectric permittivity is a fu...
A material’s dielectric properties are determined by its molecular structure, other properties of in...
By employment of state-of-the-art Vector Network Analyzers, and other wide-band measurement equipmen...
In this research paper, we propose a simple procedure for accurate, stable and broadband measurement...
Modified free space method using a vector network analyzer is proposed. The algorithm for determinin...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
It is a commonly held belief that broadband permittivity measurement techniques have great uncertain...
Two methods for measuring the dielectric constant and loss tangent of the dielectric materials using...
The work of this article is a contribution to the characterization of new materials at microwave fre...
This paper presents a fast and easy to use method to determine permittivity and loss tangent in the ...
This paper presents a broadband material characterization method applicable to measure the complex d...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
This paper presents a broadband material characterization method applicable to measure the complex d...
The authors present a new transmission line method for measuring the complex permittivity of dielect...
Millimeter wave technologies have widespread applications, for which dielectric permittivity is a fu...
A material’s dielectric properties are determined by its molecular structure, other properties of in...