This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. The cantilever problem is formulated on the basis of the modified couple stress theory and the Timoshenko beam theory. The modified couple stress theory is a nonclassical continuum theory that includes one additional material parameter to describe the size effect. By using the Hamilton's principle, the governing equation of motion and the boundary conditions are derived for the AFM cantilevers. The equation is solved using the differential quadrature method for the natural frequencies and mode shapes. The effects of the sample surface contact stiffness, length scale parameter and location of the sensor tip on the flexural vibration characteri...
A Micro-cantilever (MC) and a probe are two main components of the atomic force microscope (AFM). Th...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
Understanding the modal response of an atomic force microscope is important for the identification o...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often s...
With an optical interferometer, the free vibration spectra and the local vibration amplitude of four...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
The dynamic behavior of rectangular, dagger-shaped, V-shaped and triangular cantilevers in atomic fo...
This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), t...
The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) ca...
The quantitative evaluation of atomic force acoustic microscopy images in order to determine local i...
The majority of atomic force microcode (AFM) probes work based on piezoelectric actuation. However, ...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
In atomic force microscopy (AFM) a sharp tip fixed close to the free end of a cantilever beam intera...
A Micro-cantilever (MC) and a probe are two main components of the atomic force microscope (AFM). Th...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
Understanding the modal response of an atomic force microscope is important for the identification o...
This paper is concerned with the flexural vibration of an atomic force microscope (AFM) cantilever. ...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often s...
With an optical interferometer, the free vibration spectra and the local vibration amplitude of four...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
The dynamic behavior of rectangular, dagger-shaped, V-shaped and triangular cantilevers in atomic fo...
This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), t...
The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) ca...
The quantitative evaluation of atomic force acoustic microscopy images in order to determine local i...
The majority of atomic force microcode (AFM) probes work based on piezoelectric actuation. However, ...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
In atomic force microscopy (AFM) a sharp tip fixed close to the free end of a cantilever beam intera...
A Micro-cantilever (MC) and a probe are two main components of the atomic force microscope (AFM). Th...
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-pl...
Understanding the modal response of an atomic force microscope is important for the identification o...