In this paper, two intelligent methods which are GAs and PSO are used to model noise coupling in a Three-Dimensional Integrated Circuit (3D-IC) based on TSVs. These techniques are rarely used in this type of structure. They allow computing all the elements of the noise model, which helps to estimate the noise transfer function in the frequency and time domain in 3D complicated systems. Noise models include TSVs, active circuits, and substrate, which make them difficult to model and to estimate. Indeed, the proposed approaches based on GA and PSO are robust and powerful. To validate the method, comparisons among the results found by GA, PSO, measurements, and the 3D-TLM method, which presents an analytical technique, are made. According to t...
Three Dimensional (3D) chip integration may provide a path to miniaturization, high bandwidth, low p...
Modeling parasitic parameters of Through-Silicon-Via (TSV) structures is essential in exploring elec...
This paper investigates the influence of TSV noise coupling on nearby devices based on an extended 3...
Although a through-silicon via (TSV) is widely used in three-dimensional integrated circuit systems,...
Although a through-silicon via (TSV) is widely used in three-dimensional integrated circuit systems,...
In this paper, we proposed through silicon via (TSV) to active circuit noise coupling model based on...
cuits (ICs), which are used for connecting different active layers, introduce an important source of...
This paper explains the extraction from the measurement of the parameters necessary in time domain t...
In this paper, a new type of through-silicon via (TSV) for via-first process namely bare TSV, is pro...
With the technology nodes keep advancing, the application of TSV(Through Silicon Via) technology in ...
This paper evaluates the impact of Through-Silicon Via (TSV) on the performance and power consumptio...
This paper proposes a regression noise model that can cover the noise effect from N-coupled TSVs bas...
Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book di...
Convergence of multiple functions in a single device is the main thought behind the development of t...
This paper investigates the influence of TSV noise coupling on nearby devices based on an extended 3...
Three Dimensional (3D) chip integration may provide a path to miniaturization, high bandwidth, low p...
Modeling parasitic parameters of Through-Silicon-Via (TSV) structures is essential in exploring elec...
This paper investigates the influence of TSV noise coupling on nearby devices based on an extended 3...
Although a through-silicon via (TSV) is widely used in three-dimensional integrated circuit systems,...
Although a through-silicon via (TSV) is widely used in three-dimensional integrated circuit systems,...
In this paper, we proposed through silicon via (TSV) to active circuit noise coupling model based on...
cuits (ICs), which are used for connecting different active layers, introduce an important source of...
This paper explains the extraction from the measurement of the parameters necessary in time domain t...
In this paper, a new type of through-silicon via (TSV) for via-first process namely bare TSV, is pro...
With the technology nodes keep advancing, the application of TSV(Through Silicon Via) technology in ...
This paper evaluates the impact of Through-Silicon Via (TSV) on the performance and power consumptio...
This paper proposes a regression noise model that can cover the noise effect from N-coupled TSVs bas...
Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book di...
Convergence of multiple functions in a single device is the main thought behind the development of t...
This paper investigates the influence of TSV noise coupling on nearby devices based on an extended 3...
Three Dimensional (3D) chip integration may provide a path to miniaturization, high bandwidth, low p...
Modeling parasitic parameters of Through-Silicon-Via (TSV) structures is essential in exploring elec...
This paper investigates the influence of TSV noise coupling on nearby devices based on an extended 3...