This paper is a part of a study on the use of a single-polepiece lens as an objective lens of an analytical scanning electron microscope (SEM). The single-polepiece lens has proved to be very suitable for the efficient collection of backscattered electrons (BSE) with a multielement semiconductor detector. For the BSE images in the sum and difference modes the contrast is a non-monotonic function of the excitation of the lens, due to the complicated nature of the BSE trajectories. The use of a six-element semiconductor detector provides a whole variety of BSE signal compositions in the conventional SEM as wel
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and at...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
This paper is a part of a study on the use of a single-polepiece lens as an objective lens of an ana...
Signal mixing technique using asymetrically placed backscattered electron detectors in a scanning el...
Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scan...
Electron detectors used for imaging in the scanning electron microscope include those which detect s...
The scintillator-photomultiplier combination (Everhart-Thornley detector) for detecting secondary an...
The backscattered electron (BSE) induced secondaries (SE2) emerge from an area that is usually many ...
The backscattered electron signal in scanning electron microscopy is sensitive to changes in the ato...
In scanning microscopy in transmission (STEM) and reflection (SEM) the spreading of the spatial dist...
The work focuses especially on research of a detector for conjoint as well as separated detection of...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Solid state detectors (SSD) are the most commonly used backscattered electron (BSE) detectors in sca...
Sometimes, the sample to be examined in the SEM will consist of a compositionally non-uniform substr...
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and at...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...
This paper is a part of a study on the use of a single-polepiece lens as an objective lens of an ana...
Signal mixing technique using asymetrically placed backscattered electron detectors in a scanning el...
Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scan...
Electron detectors used for imaging in the scanning electron microscope include those which detect s...
The scintillator-photomultiplier combination (Everhart-Thornley detector) for detecting secondary an...
The backscattered electron (BSE) induced secondaries (SE2) emerge from an area that is usually many ...
The backscattered electron signal in scanning electron microscopy is sensitive to changes in the ato...
In scanning microscopy in transmission (STEM) and reflection (SEM) the spreading of the spatial dist...
The work focuses especially on research of a detector for conjoint as well as separated detection of...
The high negative bias of a sample in a scanning electron microscope constitutes the “cathode lens” ...
Solid state detectors (SSD) are the most commonly used backscattered electron (BSE) detectors in sca...
Sometimes, the sample to be examined in the SEM will consist of a compositionally non-uniform substr...
The thesis deals with the characterization of a semiconductor detector of backscattered electrons. T...
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and at...
This paper deals with the problems of backscattered electrons (BSE) detection in low voltage scannin...