Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior of A/D converters. Accurate test results require wise choice of the test settings and signal parameters. However, standard methods do not support the recognition of bad parameter settings. In addition, those may provide inaccurate results even when the signal settings are optimal for the histogram test. This paper presents a software which helps handling above problems and deficiencies to guarantee the quality of the test results
International audienceTesting of Analog-to-Digital Converters is classically composed of two success...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
of the Thesis Presented in Partial Fulfillment of the Requirements for the Degree of Master of Scien...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns assoc...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Abstract – This paper deals with an innovative strategy to shorten the record size required to estim...
Abstract. The histogram method is a very classical test technique for Analog to Digital Converters (...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
This work presents a new method to estimate the nonlinearity characteristics of analog-to-digital co...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
Issued as final reportLinearity testing of high-precision (beyond 20-bit resolution) Analog-to-Digit...
Call number: LD2668 .R4 EECE 1989 S54Master of ScienceElectrical and Computer Engineerin
International audienceTesting of Analog-to-Digital Converters is classically composed of two success...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
of the Thesis Presented in Partial Fulfillment of the Requirements for the Degree of Master of Scien...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns assoc...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Abstract – This paper deals with an innovative strategy to shorten the record size required to estim...
Abstract. The histogram method is a very classical test technique for Analog to Digital Converters (...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
This work presents a new method to estimate the nonlinearity characteristics of analog-to-digital co...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
Issued as final reportLinearity testing of high-precision (beyond 20-bit resolution) Analog-to-Digit...
Call number: LD2668 .R4 EECE 1989 S54Master of ScienceElectrical and Computer Engineerin
International audienceTesting of Analog-to-Digital Converters is classically composed of two success...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
of the Thesis Presented in Partial Fulfillment of the Requirements for the Degree of Master of Scien...