Add to ORKGData compiled for the purpose of evaluating the effect of power/temperature step stress when applied to the diode JANTX1N5420 manufactured by Unitrode and Micro-Semiconductor is presented. A total of 48 samples from each manufacturer was submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing
The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured...
Power/temperature step stress was applied to the Zener diode JANTX1N981B. Reliability of the device ...
The effect of power/temperature step stress was studied when applied to the Diode JANTX1N5619 manufa...
The reliability of switching diode JANTX1N5614 was tested. The effect of power/temperature step stre...
Data were compiled for the purpose of evaluating the effect of power/temperature step stress when ap...
The effect of power/temperature step stress when applied to a variety of semiconductor devices was e...
The effect was studied of power/temperature step stress when applied to the PNP transistor JANTX2N26...
The effect of power/temperature step stress when applied to the dual transistor JANTX2N2060 manufact...
The effect of power/temperature step stress when applied to a variety of voltage regulating diodes m...
Data for the purpose of evaluating the effect of power/temperature step stress when applied to a var...
The effect was studied of power/temperature step stress when applied to the switching diode JANTX1N5...
Power/temperature step stress was applied to the transistor JANTX2N2432A manufactured by Crystalonic...
Data compiled for the purpose of evaluating the effect of power/temperature step stress when applied...
The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured...
The effect was investigated of power/temperature step stress when applied to the zener diode JANTX1N...
The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured...
Power/temperature step stress was applied to the Zener diode JANTX1N981B. Reliability of the device ...
The effect of power/temperature step stress was studied when applied to the Diode JANTX1N5619 manufa...
The reliability of switching diode JANTX1N5614 was tested. The effect of power/temperature step stre...
Data were compiled for the purpose of evaluating the effect of power/temperature step stress when ap...
The effect of power/temperature step stress when applied to a variety of semiconductor devices was e...
The effect was studied of power/temperature step stress when applied to the PNP transistor JANTX2N26...
The effect of power/temperature step stress when applied to the dual transistor JANTX2N2060 manufact...
The effect of power/temperature step stress when applied to a variety of voltage regulating diodes m...
Data for the purpose of evaluating the effect of power/temperature step stress when applied to a var...
The effect was studied of power/temperature step stress when applied to the switching diode JANTX1N5...
Power/temperature step stress was applied to the transistor JANTX2N2432A manufactured by Crystalonic...
Data compiled for the purpose of evaluating the effect of power/temperature step stress when applied...
The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured...
The effect was investigated of power/temperature step stress when applied to the zener diode JANTX1N...
The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured...
Power/temperature step stress was applied to the Zener diode JANTX1N981B. Reliability of the device ...
The effect of power/temperature step stress was studied when applied to the Diode JANTX1N5619 manufa...