Charging of insulators is a complex phenomenon to simulate since the accuracy of the simulations is very sensitive to the interaction of electrons with matter and electric fields. In this study, we report model improvements for a previously developed Monte-Carlo simulator to more accurately simulate samples that charge. The improvements include both modelling of low energy electron scattering and charging of insulators. The new first-principle scattering models provide a more realistic charge distribution cloud in the material, and a better match between non-charging simulations and experimental results. Improvements on charging models mainly focus on redistribution of the charge carriers in the material with an induced conductivity (EBIC) ...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
Charging effect frequently occurs when characterizing nonconductive materials using electrons as pro...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
International audienceThe problem of the charge distribution within an insulator bombarded by a narr...
International audienceThe problem of the charge distribution within an insulator bombarded by a narr...
International audienceWe are dealing with the problem of the charge distribution within an insulator...
International audienceElectron beam irradiation and the self-consistent charge transport in bulk ins...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Charging and discharging phenomenon on the surface of materials can be found in plasma display pane...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
International audienceWe are dealing with secondary electron emission phenomena of insulators as the...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
Charging effect frequently occurs when characterizing nonconductive materials using electrons as pro...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
Background: Charging of insulators is a complex phenomenon to simulate since the accuracy of the sim...
International audienceThe problem of the charge distribution within an insulator bombarded by a narr...
International audienceThe problem of the charge distribution within an insulator bombarded by a narr...
International audienceWe are dealing with the problem of the charge distribution within an insulator...
International audienceElectron beam irradiation and the self-consistent charge transport in bulk ins...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Publié suite au congrès : 9th Electroceramics Congress Cherbourg, FRANCE, MAY 31-JUN 06, 2004Interna...
Charging and discharging phenomenon on the surface of materials can be found in plasma display pane...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
International audienceWe are dealing with secondary electron emission phenomena of insulators as the...
Charging and discharging phenomenon on the surface of materials can be found in plasma display panel...
Electron microscopes take advantage of a beam of electrons to illuminate aspecimen and extract the n...
Charging effect frequently occurs when characterizing nonconductive materials using electrons as pro...