Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid

A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of an α-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid