Design and test of field programmable gate arrays in space applications

Field Programmable Gate Arrays (FPGAU's) offer substantial benefits in terms of flexibility and design integration. In addition to qualifying this device for space applications by establishing its reliability and evaluating its sensitivity to radiation, screening the programmed devices with Automatic Test Equipment (ATE) and functional burn-in presents an interesting challenge. This paper presents a review of the design, qualification, and screening cycle employed for FPGA designs in a space program, and demonstrates the need for close interaction between design and test engineers