Ni-MH storage test and cycle life test

Gates Aerospace Batteries is conducting two long term test programs to fully characterize the NiMH cell technology for aerospace applications. The first program analyzes the effects of long term storage upon cell performance. The second program analyzes cycle life testing and preliminary production lot testing. This paper summarizes these approaches to testing the NiMH couple and culminates with initial storage and testing recommendations. Long term storage presents challenges to deter the adverse condition of capacity fade in NiMH cells. Elevated but stabilized pressures and elevated but stabilized end-of-charge voltages also appear to be a characteristic phenomenon of long term storage modes. However, the performance degradation is dependent upon specific characteristics of the metal-hydride alloy. To date, there is no objective evidence with which to recommend the proper method for storage and handling of NiMH cells upon shipment. This is particularly critical due to limited data points that indicate open circuit storage at room temperature for 60 to 90 days will result in irrecoverable capacity loss. Accordingly a test plan was developed to determine what method of mid-term to long-term storage will prevent irrecoverable capacity loss. The explicit assumption is that trickle charging at some rate above the self-discharge rate will prevent the irreversible chemical changes to the negative electrode that result in the irrecoverable capacity loss. Another premise is that lower storage temperatures, typically 0 C for aerospace customers, will impede any negative chemical reactions. Three different trickle charge rates are expected to yield a fairly flat response with respect to recoverable capacity versus baseline cells in two different modes of open circuit. Specific attributes monitored include: end-of-charge voltage, end-of-charge pressure, mid-point discharge voltage, capacity, and end-of-discharge pressure. Cycle life testing and preliminary production lot testing continue to dominate the overall technology development effort at GAB. The cell life test program reflects continuing improvements in baseline cell designs. Performance improvements include lower and more stable charge voltages and pressures. The continuing review of production lot testing assures conformance to the design criteria and expectations. This is especially critical during this period of transferring technology from research and development status to production