Carbon nanotubes (CNTs) offer great potential for advanced sensor development due to the unique electronic transport properties of the material. However, a significant obstacle to the realization of practical CNT devices is the formation of reliable and reproducible CNT to metallic contacts. In this work, scanning probe techniques are explored for both fabrication of metallic junctions and positioning of singlewalled CNTs across these junctions. The use of a haptic force feedback interface to a scanning probe microscope is used to enable movement of nanotubes over micron length scales with nanometer precision. In this case, imaging of the surface is performed with light or intermittent contact to the surface. Increased tip-to-sample interac...
Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution...
* Abstract- Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its sm...
In this paper we present results of our recent efforts to understand the mechanical interface behavi...
Carbon nanotubes (CNTs) possess unique electrical, thermal, and mechanical properties which have led...
Carbon nanotube (CNT) related nanostructures possess remarkable electrical, mechanical, and thermal ...
We have investigated the possibility of using carbon nanotubes as flexible, mobile electrical probes...
Carbon nanotubes (CNT) are among the candidates for atomic force microscopy probes for use in high a...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Ballistic and spin coherent transport in single walled carbon nanotubes (SWCNT) are predicted to ena...
We demonstrate a simple method that uses a scanning electron microscope for making a reliable low re...
[[abstract]]This paper demonstrates the fabrication of a micro-cantilever equipped with a high aspec...
Abstract Using an atomic force microscope (AFM) at a controlled contact force, we report the electri...
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to con...
We describe a method for producing and characterizing electrically connected single-wall carbon nano...
Abstract. This paper summarizes scanning probe microscopy investigations of the properties and manip...
Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution...
* Abstract- Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its sm...
In this paper we present results of our recent efforts to understand the mechanical interface behavi...
Carbon nanotubes (CNTs) possess unique electrical, thermal, and mechanical properties which have led...
Carbon nanotube (CNT) related nanostructures possess remarkable electrical, mechanical, and thermal ...
We have investigated the possibility of using carbon nanotubes as flexible, mobile electrical probes...
Carbon nanotubes (CNT) are among the candidates for atomic force microscopy probes for use in high a...
Carbon nanotubes are considered to be an ideal imaging tip for atomic force microscopy (AFM) applica...
Ballistic and spin coherent transport in single walled carbon nanotubes (SWCNT) are predicted to ena...
We demonstrate a simple method that uses a scanning electron microscope for making a reliable low re...
[[abstract]]This paper demonstrates the fabrication of a micro-cantilever equipped with a high aspec...
Abstract Using an atomic force microscope (AFM) at a controlled contact force, we report the electri...
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to con...
We describe a method for producing and characterizing electrically connected single-wall carbon nano...
Abstract. This paper summarizes scanning probe microscopy investigations of the properties and manip...
Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution...
* Abstract- Carbon nanotube (CNT) is an ideal candidate for future nanoelectronics because of its sm...
In this paper we present results of our recent efforts to understand the mechanical interface behavi...