X-ray microtomography using correlation of near-field speckles for material characterization

8siNondestructive microscale investigation of objects is an invaluable tool in life and materials sciences. Currently, such investigation is mainly performed with X-ray laboratory systems, which are based on absorption-contrast imaging and cannot access the information carried by the phase of the X-ray waves. The phase signal is, nevertheless, of great value in X-ray imaging as it is complementary to the absorption information and in general more sensitive to visualize features with small density differences. Synchrotron facilities, which deliver a beam of high brilliance and high coherence, provide the ideal condition to develop such advanced phase-sensitive methods, but their access is limited. Here we show how a small modification of a laboratory setup yields simultaneously quantitative and 3D absorption and phase images of the object. This single-shot method is based on correlation of X-ray near-field speckles and represents a significant broadening of the capabilities of laboratory- based X-ray tomography.noneopenIrene Zanette, Marie-Christine Zdora, Tunhe Zhou, Anna Burvall, Daniel H. Larsson, Pierre Thibault, Hans M. Hertz, Franz PfeifferZanette, Irene; Zdora, Marie-Christine; Zhou, Tunhe; Burvall, Anna; Larsson, Daniel H.; Thibault, Pierre; Hertz, Hans M.; Pfeiffer, Fran