Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

8siA technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. © 2010 Elsevier B.V. All rights reserved.nonemixedCameron M.Kewish, Pierre Thibault, Martin Dierolf, Oliver Bunk, Andreas Menzel, Joan Vila-Comamala, Konstantins Jefimovs, Franz PfeifferKewish, Cameron M.; Thibault, Pierre; Dierolf, Martin; Bunk, Oliver; Menzel, Andreas; Vila-Comamala, Joan; Jefimovs, Konstantins; Pfeiffer, Fran