A technique for improving ion implanter productivity is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for improving productivity of an ion implanter having an ion source chamber. The method may comprise supplying a gaseous substance to the ion source chamber, the gaseous substance comprising one or more reactive species for generating ions for the ion implanter. The method may also comprise stopping the supply of the gaseous substance to the ion source chamber. The method may further comprise supplying a hydrogen containing gas to the ion source chamber for a period of time after stopping the supply of the gaseous substance
DE 19846926 A UPAB: 20000624 NOVELTY - The method involves measuring a parameter corresponding. to t...
A 280 KeV ion implantation facility has been developed for research of surface modification of metal...
An ion implanter of cylindrical geometry is described suitable for uniform implantation at a few keV...
A technique for improving ion implanter productivity is disclosed. In one particular exemplary embod...
An ion implantation device with a dual pumping mode and method thereof for use in producing atomic o...
A technique for improving ion implantation based on ion beam angle-related information is disclosed....
A method for ion implantation induced embedded particle formation via reduction with the steps of io...
Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary em...
A technique for low-temperature ion implantation is disclosed. In one particular exemplary embodimen...
Techniques for reducing effects of photoresist outgassing are disclosed. In one particular exemplary...
A technique for uniformity tuning in an ion implanter system is disclosed. In one particular exempla...
Techniques for low-temperature ion implantation are disclosed. In one particular exemplary embodimen...
An ion implanter includes a source of a stationary, planar ion beam, a set of beamline components th...
Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary em...
The ionization efficiency is one of the most important parameters of an on-line used target-ion sour...
DE 19846926 A UPAB: 20000624 NOVELTY - The method involves measuring a parameter corresponding. to t...
A 280 KeV ion implantation facility has been developed for research of surface modification of metal...
An ion implanter of cylindrical geometry is described suitable for uniform implantation at a few keV...
A technique for improving ion implanter productivity is disclosed. In one particular exemplary embod...
An ion implantation device with a dual pumping mode and method thereof for use in producing atomic o...
A technique for improving ion implantation based on ion beam angle-related information is disclosed....
A method for ion implantation induced embedded particle formation via reduction with the steps of io...
Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary em...
A technique for low-temperature ion implantation is disclosed. In one particular exemplary embodimen...
Techniques for reducing effects of photoresist outgassing are disclosed. In one particular exemplary...
A technique for uniformity tuning in an ion implanter system is disclosed. In one particular exempla...
Techniques for low-temperature ion implantation are disclosed. In one particular exemplary embodimen...
An ion implanter includes a source of a stationary, planar ion beam, a set of beamline components th...
Techniques for temperature-controlled ion implantation are disclosed. In one particular exemplary em...
The ionization efficiency is one of the most important parameters of an on-line used target-ion sour...
DE 19846926 A UPAB: 20000624 NOVELTY - The method involves measuring a parameter corresponding. to t...
A 280 KeV ion implantation facility has been developed for research of surface modification of metal...
An ion implanter of cylindrical geometry is described suitable for uniform implantation at a few keV...