Electrical properties of Bi-implanted amorphous chalcogenide films

  • Fedorenko, YG
  • Hughes, MA
  • Colaux, JL
  • Jeynes, C
  • Gwilliam, RM
  • Homewood, K
  • Gholipour, B
  • Yao, J
  • Hewak, DW
  • Lee, T-H
  • Elliott, SR
  • Curry, RJ
Publication date
October 2014

Abstract

The impact of Bi implantation on the conductivity and the thermopower of amorphous chalcogenide films is investigated. Incorporation of Bi in Ge-Sb-Te and GeTe results in enhanced conductivity. The negative Seebeck coefficient confirms onset of the electron conductivity in GeTe implanted with Bi at a dose of 2x1016 cm-2. The enhanced conductivity is accompanied by defect accumulation in the films upon implantation as is inferred by using analysis of the space-charge limited current. The results indicate that native coordination defects in lone-pair semiconductors can be deactivated by means of ion implantation, and higher conductivity of the films stems from additional electrically active defects created by implantation of bismuth

Extracted data

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