Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ranging from a few kilohertz to at least one terahertz. At radio and microwave frequencies, there are well-established methods for assessing the quality and confidence of these measurements, when they are made in coaxial lines. These methods are usually based on determining the size of residual errors that remain in the VNA after calibration. To date, the performance of these methods has not been investigated in rectangular waveguide, and, at millimetre- and submillimetre-wave frequencies. This paper investigates the application of one of these techniques for waveguide measurements at microwave, millimetre- and submillimetre-wave frequencies. T...
This paper describes some further investigations into the connection repeatability for waveguide dev...
This technical report describes the uncertainty assessment on scattering parameter measurements obta...
We present a strategy for correcting for imperfect interfaces between the test ports of a vector net...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
In its fundamental form, network analysis involves the measurement of incident, reflected, and trans...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to charac...
This book describes vector network analyzer measurements and uncertainty assessments, particularly i...
In this paper, we describe a new measurement capability which provides fully calibrated, traceable s...
This paper describes some further investigations into the connection repeatability for waveguide dev...
This technical report describes the uncertainty assessment on scattering parameter measurements obta...
We present a strategy for correcting for imperfect interfaces between the test ports of a vector net...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
In its fundamental form, network analysis involves the measurement of incident, reflected, and trans...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to charac...
This book describes vector network analyzer measurements and uncertainty assessments, particularly i...
In this paper, we describe a new measurement capability which provides fully calibrated, traceable s...
This paper describes some further investigations into the connection repeatability for waveguide dev...
This technical report describes the uncertainty assessment on scattering parameter measurements obta...
We present a strategy for correcting for imperfect interfaces between the test ports of a vector net...