Single event upset (SEU) analysis of complex systems is challenging. Currently, system SEU analysis is performed by component level partitioning and then either: the most dominant SEU cross-sections (SEUs) are used in system error rate calculations; or the partition SEUs are summed to eventually obtain a system error rate. In many cases, system error rates are overestimated because these methods generally overlook system level derating factors. The problem with overestimating is that it can cause overdesign and consequently negatively affect the following: cost, schedule, functionality, and validation/verification. The scope of this presentation is to discuss the risks involved with our current scheme of SEU analysis for complex systems; an...
The presentation will cover a variety of mitigation strategies that were developed for critical appl...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
The Embedded system design is characterized by its daily complexity. It integrates a hardware and so...
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...
Sterpone L, Margaglia F, Köster M, Hagemeyer J, Porrmann M. Analysis of SEU Effects in Partially Rec...
With the increasing packing densities in VLSI technology, Single Event Upsets (SEU) due to cosmic ra...
A method for constructing upper bound estimates for device single event upset (SEU) rates is present...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
Control flow errors have been widely addressed in literature as a possible threat to the dependabili...
Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...
International audienceThis paper describes two different but complementary approaches that can be us...
The presentation will cover a variety of mitigation strategies that were developed for critical appl...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
The Embedded system design is characterized by its daily complexity. It integrates a hardware and so...
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...
Sterpone L, Margaglia F, Köster M, Hagemeyer J, Porrmann M. Analysis of SEU Effects in Partially Rec...
With the increasing packing densities in VLSI technology, Single Event Upsets (SEU) due to cosmic ra...
A method for constructing upper bound estimates for device single event upset (SEU) rates is present...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
Control flow errors have been widely addressed in literature as a possible threat to the dependabili...
Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...
International audienceThis paper describes two different but complementary approaches that can be us...
The presentation will cover a variety of mitigation strategies that were developed for critical appl...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...