Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, we measured absolute refractive indices at temperatures from 100 to 310 K at wavelengths from 0.42 to 3.6 microns for CaF2, Suprasil 3001 fused silica, and S-FTM16 glass in support of lens designs for the Near Infrared Spectrometer and Photometer (NISP) for ESA's Euclid dark energy mission. We report absolute refractive index, dispersion (dn/d), and thermo-optic coefficient (dn/dT) for these materials. In this study, materials from different melts were procured to understand index variability in each material. We provide temperature-dependent Sellmeier coefficients based on our data to allow accurate interpolation of index to other ...
We have developed and tested a novel application of interferometry to determine the absolute refract...
A model describing the temperature effect of liquid crystal (LC) refractive indices is derived and c...
Current material identification techniques rely on estimating reflectivity or emissivity which vary ...
Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Fligh...
In order to enable high quality lens designs using N-BK7, BaLKN3, and SF15 at cryogenic temperatures...
The Transiting Exoplanet Survey Satellite (TESS) is an explorer-class planet finder, whose principal...
The success of numerous upcoming NASA infrared (IR) missions will rely critically on accurate knowle...
In order to enable high quality lens designs using N-BK7, BaLKN3, SF15, and E-SF03 at cryogenic temp...
Silicon and germanium are perhaps the two most well-understood semiconductor materials in the contex...
In this paper, we present a simple cascaded Fabry-Perot interferometer (FPI) that can be used to mea...
The general goal was to build a data base containing optical properties, such as reflectance, transm...
We report transmission measurements at cryogenic temperatures for 4 broad-band filters of the Mauna ...
The Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Flight Cent...
Exoplanet science requires extreme wavefront stability (10 pm change/10 minutes), so every source of...
International audienceWe report on the simultaneous characterization of temperature map and thermal ...
We have developed and tested a novel application of interferometry to determine the absolute refract...
A model describing the temperature effect of liquid crystal (LC) refractive indices is derived and c...
Current material identification techniques rely on estimating reflectivity or emissivity which vary ...
Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Fligh...
In order to enable high quality lens designs using N-BK7, BaLKN3, and SF15 at cryogenic temperatures...
The Transiting Exoplanet Survey Satellite (TESS) is an explorer-class planet finder, whose principal...
The success of numerous upcoming NASA infrared (IR) missions will rely critically on accurate knowle...
In order to enable high quality lens designs using N-BK7, BaLKN3, SF15, and E-SF03 at cryogenic temp...
Silicon and germanium are perhaps the two most well-understood semiconductor materials in the contex...
In this paper, we present a simple cascaded Fabry-Perot interferometer (FPI) that can be used to mea...
The general goal was to build a data base containing optical properties, such as reflectance, transm...
We report transmission measurements at cryogenic temperatures for 4 broad-band filters of the Mauna ...
The Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Flight Cent...
Exoplanet science requires extreme wavefront stability (10 pm change/10 minutes), so every source of...
International audienceWe report on the simultaneous characterization of temperature map and thermal ...
We have developed and tested a novel application of interferometry to determine the absolute refract...
A model describing the temperature effect of liquid crystal (LC) refractive indices is derived and c...
Current material identification techniques rely on estimating reflectivity or emissivity which vary ...