Add to ORKGSingle-event effect (SEE) and total ionizing dose (TID) test results are presented for various hardened and commercial power metal-oxide-semiconductor field effect transistors (MOSFETs), including vertical planar, trench, superjunction, and lateral process designs
As an emerging technology, silicon carbide (SiC) power MOSFETs are showing great potential for highe...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Power systems designed for use in NASA space missions are required to work reliably under harsh cond...
Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs...
Single-event effect (SEE) test results are presented for commercial grade, automotive grade, and rad...
Recent work for the NASA Electronic Parts and Packaging Program Power MOSFET task is presented. The ...
This study was being undertaken to determine the single event effect susceptibility of the commercia...
The underlying physical mechanisms of destructive single event effects (SEE) from heavy ion radiatio...
abstract: In recent years, the Silicon Super-Junction (SJ) power metal-oxide semiconductor field-eff...
NASA missions require innovative power electronics system and component solutions with long life cap...
NASA missions require innovative power electronics system and component solutions with long life cap...
Galactic-cosmic-rays (GCR) exist in space from unknown origins. A cosmic ray is a very high energy e...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...
As an emerging technology, silicon carbide (SiC) power MOSFETs are showing great potential for highe...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Power systems designed for use in NASA space missions are required to work reliably under harsh cond...
Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs...
Single-event effect (SEE) test results are presented for commercial grade, automotive grade, and rad...
Recent work for the NASA Electronic Parts and Packaging Program Power MOSFET task is presented. The ...
This study was being undertaken to determine the single event effect susceptibility of the commercia...
The underlying physical mechanisms of destructive single event effects (SEE) from heavy ion radiatio...
abstract: In recent years, the Silicon Super-Junction (SJ) power metal-oxide semiconductor field-eff...
NASA missions require innovative power electronics system and component solutions with long life cap...
NASA missions require innovative power electronics system and component solutions with long life cap...
Galactic-cosmic-rays (GCR) exist in space from unknown origins. A cosmic ray is a very high energy e...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...
As an emerging technology, silicon carbide (SiC) power MOSFETs are showing great potential for highe...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
Power systems designed for use in NASA space missions are required to work reliably under harsh cond...