NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Radiation Effects of Commercial Resistive Random Access Memories

Chen, Dakai
Khachatrian, Ani
Wilcox, Edward
Roche, Nicolas
Buchner, Stephen
Kim, Hak
LaBel, Kenneth A.
Phan, Anthony
Berg, Melanie
Figueiredo, Marco

June 2014

We present results for the single-event effect response of commercial production-level resistive ran...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Chen, Dakai
Wilcox, Edward Palmer
Lauenstein, Jean-Marie
Label, Kenneth A.
Campola, Michael Joseph
Pellish, Jonathan Allen
Casey, Megan Colleen
Guertin, Steven Michael
Wyrwas, Edward J.
O'Bryan, Martha V.
Berg, Melanie D.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Berg, Melanie
LaBel, Kenneth
Pellish, Jonathan

June 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Seidleck, Christina
LaBel, Ken
Kim, Hak
Phan, Anthony
Berg, Melanie

May 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

Campola, Michael
Label, Kenneth
Berg, Melanie
Pellish, Jonathan

June 2017

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Single Event Effects in FPGA Devices 2015-2016

Pellish, Jonathan
LaBel, Kenneth
Berg, Melanie

June 2016

This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

LaBel, Kenneth A.
Berg, Melanie D.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Standardizing Microprocessor and GPU Radiation Test Approaches

Wyrwas, Edward J.

July 2019

Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Evaluation of System Reliability and Heavy Ion Angular Effects

Berg, Melanie
Campola, Michael

February 2019

Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...

Advanced CMOS Radiation Effects Testing and Analysis

Pellish, J. A.
Marshall, P. W.
Castaneda, C. M.
Berg, M. D.
Rodbell, K. P.
Phan, A. M.
Seidleck, C. M.
Dodds, N. A.
Kim, H. S.
LaBel, K. A.
Gordon, M. S.
Schwank, J. R.

June 2014

Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis

Friendlich, M. A.
Seidlick, C. M.
Berg, M. D.
LaBel, K. A.
Kim, H. S.
Perez, C. E.

July 2011

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...

The NASA Electronic Parts and Packaging (NEPP) Program - Field Programmable Gate Array (FPGA) Tasks/Considerations

LaBel, Kenneth A.

June 2014

This presentation includes NASA Electronic Parts and Packaging (NEPP) Program Field Programmable Gat...

Radiation Effects of Commercial Resistive Random Access Memories

Chen, Dakai
Khachatrian, Ani
Wilcox, Edward
Roche, Nicolas
Buchner, Stephen
Kim, Hak
LaBel, Kenneth A.
Phan, Anthony
Berg, Melanie
Figueiredo, Marco

June 2014

We present results for the single-event effect response of commercial production-level resistive ran...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Chen, Dakai
Wilcox, Edward Palmer
Lauenstein, Jean-Marie
Label, Kenneth A.
Campola, Michael Joseph
Pellish, Jonathan Allen
Casey, Megan Colleen
Guertin, Steven Michael
Wyrwas, Edward J.
O'Bryan, Martha V.
Berg, Melanie D.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Berg, Melanie
LaBel, Kenneth
Pellish, Jonathan

June 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Seidleck, Christina
LaBel, Ken
Kim, Hak
Phan, Anthony
Berg, Melanie

May 2016

We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

Campola, Michael
Label, Kenneth
Berg, Melanie
Pellish, Jonathan

June 2017

This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Single Event Effects in FPGA Devices 2015-2016

Pellish, Jonathan
LaBel, Kenneth
Berg, Melanie

June 2016

This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

LaBel, Kenneth A.
Berg, Melanie D.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Standardizing Microprocessor and GPU Radiation Test Approaches

Wyrwas, Edward J.

July 2019

Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Evaluation of System Reliability and Heavy Ion Angular Effects

Berg, Melanie
Campola, Michael

February 2019

Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data ...

Advanced CMOS Radiation Effects Testing and Analysis

Pellish, J. A.
Marshall, P. W.
Castaneda, C. M.
Berg, M. D.
Rodbell, K. P.
Phan, A. M.
Seidleck, C. M.
Dodds, N. A.
Kim, H. S.
LaBel, K. A.
Gordon, M. S.
Schwank, J. R.

June 2014

Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...

Incorporating Probability Models of Complex Test Structures to Perform Technology Independent FPGA Single Event Upset Analysis

Friendlich, M. A.
Seidlick, C. M.
Berg, M. D.
LaBel, K. A.
Kim, H. S.
Perez, C. E.

July 2011

We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...

The NASA Electronic Parts and Packaging (NEPP) Program - Field Programmable Gate Array (FPGA) Tasks/Considerations

LaBel, Kenneth A.

June 2014

This presentation includes NASA Electronic Parts and Packaging (NEPP) Program Field Programmable Gat...

Radiation Effects of Commercial Resistive Random Access Memories

Chen, Dakai
Khachatrian, Ani
Wilcox, Edward
Roche, Nicolas
Buchner, Stephen
Kim, Hak
LaBel, Kenneth A.
Phan, Anthony
Berg, Melanie
Figueiredo, Marco

June 2014

We present results for the single-event effect response of commercial production-level resistive ran...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Chen, Dakai
Wilcox, Edward Palmer
Lauenstein, Jean-Marie
Label, Kenneth A.
Campola, Michael Joseph
Pellish, Jonathan Allen
Casey, Megan Colleen
Guertin, Steven Michael
Wyrwas, Edward J.
O'Bryan, Martha V.
Berg, Melanie D.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Abstract

Extracted data

NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data

Abstract

Extracted data

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