Add to ORKGThis presentation provides an overview of single event effects in FPGA devices 2015-2016 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing. Mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...
Finite state-machines (FSMs) are used to control operational flow in application specific integrated...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
It has been shown that, when exposed to radiation environments, each Field Programmable Gate Array (...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
This presentation on Field Programmable Gate Array (FPGA) Devices will include challenges for critic...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation is an introduction to Field Programmable Gate Array (FPGA) devices and the challen...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
The presentation will cover a variety of mitigation strategies that were developed for critical appl...
This presentation includes NASA Electronic Parts and Packaging (NEPP) Program Field Programmable Gat...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...
Finite state-machines (FSMs) are used to control operational flow in application specific integrated...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
It has been shown that, when exposed to radiation environments, each Field Programmable Gate Array (...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
This presentation on Field Programmable Gate Array (FPGA) Devices will include challenges for critic...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation is an introduction to Field Programmable Gate Array (FPGA) devices and the challen...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
The presentation will cover a variety of mitigation strategies that were developed for critical appl...
This presentation includes NASA Electronic Parts and Packaging (NEPP) Program Field Programmable Gat...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
We present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorpor...
Finite state-machines (FSMs) are used to control operational flow in application specific integrated...