Reliability equivalence factors for a series-parallel system assuming an exponentiated weibull distribution

In this study, we discuss the reliability equivalence factors of a series-parallel system with n series subsystems connected in parallel where subsystem i has m(i) independent and identically distributed components. We assume that each component has an exponentiated Weibull distribution. We consider improving the reliability of the system by (a) a reduction method and (b) several duplication methods: (i) hot duplication; (ii) cold duplication with perfect switch; (iii) cold duplication with imperfect switch. We compute two types of reliability equivalence factors: survival equivalence factors (SREF) and mean equivalence factors (MREF). We illustrate the results obtained with an application example