Routine monitoring of the wire bonding process requires real-time evaluation and control of wire bond quality. In this paper, we present a nondestructive technique for detecting bond quality by the application of a semisupervised classification algorithm to process the signals obtained from an ultrasonic generator. Experimental tests verified that the classification method is capable of accurately predicting bond quality, indicated by bonded area measured by X-ray tomography. Samples classified during bonding were subjected to temperature cycling between -55 °C and +125 °C, and the distribution of bond life amongst the different classes was analyzed. It is demonstrated that the as-bonded quality classification is closely correlated with the...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this paper, thermal cycling reliability along with ANSYS analysis of the residual stress generate...
Routine monitoring of the wire bonding process requires real-time evaluation and control of wire bon...
Abstract The reliable performance of power electronic modules has been a concern for many years due...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
Abstract The reliable performance of power electronic modules has been a concern for many years due...
© 2016, The Author(s). Ultrasonically bonded heavy Al wires subjected to a small junction temperatur...
© 2016, The Author(s). Ultrasonically bonded heavy Al wires subjected to a small junction temperatur...
This paper concerns the non-destructive visualisation of the evolution of damage within ultrasonical...
Ultrasonically bonded heavy Al wires subjected to a small junction temperature fluctuation under pow...
Ultrasonically bonded Al wire bonds on Al metallization pads are widely used in power semiconductors...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this paper, thermal cycling reliability along with ANSYS analysis of the residual stress generate...
Routine monitoring of the wire bonding process requires real-time evaluation and control of wire bon...
Abstract The reliable performance of power electronic modules has been a concern for many years due...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples w...
Abstract The reliable performance of power electronic modules has been a concern for many years due...
© 2016, The Author(s). Ultrasonically bonded heavy Al wires subjected to a small junction temperatur...
© 2016, The Author(s). Ultrasonically bonded heavy Al wires subjected to a small junction temperatur...
This paper concerns the non-destructive visualisation of the evolution of damage within ultrasonical...
Ultrasonically bonded heavy Al wires subjected to a small junction temperature fluctuation under pow...
Ultrasonically bonded Al wire bonds on Al metallization pads are widely used in power semiconductors...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bo...
In this paper, thermal cycling reliability along with ANSYS analysis of the residual stress generate...