Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer

We present the latest generation of superconductor–insulator–ferromagnet–superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d1 and d2 in both halves were varied to obtain different combinations of positive and negative critical current densities jc, 1 and jc, 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves