Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitoring, and so on. These on-chip instruments must be accessed through the ICs’ life- time. However, when ICs are mounted on Printed Circuit Boards (PCBs), access from system-level is challenged due to complex system hierarchies with a multitude of interfaces. In this paper we enable access from system-level to chip-level instruments by proposing hardware, protocol, and communication schemes. We have validated our scheme by implementing a system with two ICs on a Field-Programmable Gate Array (FPGA) where each IC includes an IEEE Std. 1687 network, communication between ICs is with Serial Peripheral Interface (SPI) and communication with the outs...
Technology down-scaling and platform-based designs have enforced a number of application and archite...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
The semiconductor technology development con- stantly enables integrated circuits (ICs) with more, f...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
The constant need for higher performance and more advanced functionality has made the design and man...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
Traditional test and measurement equipment that relies on connecting external probes is no longer p...
Technology down-scaling and platform-based designs have enforced a number of application and archite...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
The semiconductor technology development con- stantly enables integrated circuits (ICs) with more, f...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable acces...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
The constant need for higher performance and more advanced functionality has made the design and man...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
Traditional test and measurement equipment that relies on connecting external probes is no longer p...
Technology down-scaling and platform-based designs have enforced a number of application and archite...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...