This thesis presents the realization of a characterization method for optical waveguides in terms of propagation loss. The method employs a highly linear video camera aided by a personal computer running image processing and analysis software. After a brief theoretical overview, the design of the experimental set-up and its realization are introduced. Several optical waveguides are examined using the present method and loss values are obtained for various channel waveguides built on silicon substrates, with the experimental results detailed for two such wafers. The advantages and limitations of the method are also briefly discussed
Communication technologies today are increasingly reliant on the manipulation of optical signals whe...
International audienceWe propose and demonstrate a nondestructive method for loss measurement in opt...
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant...
Because optical waveguides naturally have loss, methods to measure loss have been developed. The ide...
A method to measure the propagation loss of optical waveguides is discussed. The measurement system ...
The photodeflection method applied to the propagation losses characterization in channel waveguides ...
A novel method is presented to measure the propagation loss of integrated optical waveguides. The me...
©2008 SPIE--The International Society for Optical Engineering. One print or electronic copy may be m...
Optical waveguide propagation loss measurement method based on optical multiple reflections detectio...
We propose and demonstrate a nondestructive method for loss measurement in optical guided structures...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN021719 / BLDSC - British Library D...
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interf...
A method that uses the data of ray tracing for optical waveguide lens diagnostics is described. This...
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-...
A new method for measuring waveguide propagation loss in silicon nanowires is presented. This method...
Communication technologies today are increasingly reliant on the manipulation of optical signals whe...
International audienceWe propose and demonstrate a nondestructive method for loss measurement in opt...
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant...
Because optical waveguides naturally have loss, methods to measure loss have been developed. The ide...
A method to measure the propagation loss of optical waveguides is discussed. The measurement system ...
The photodeflection method applied to the propagation losses characterization in channel waveguides ...
A novel method is presented to measure the propagation loss of integrated optical waveguides. The me...
©2008 SPIE--The International Society for Optical Engineering. One print or electronic copy may be m...
Optical waveguide propagation loss measurement method based on optical multiple reflections detectio...
We propose and demonstrate a nondestructive method for loss measurement in optical guided structures...
SIGLEAvailable from British Library Document Supply Centre-DSC:DXN021719 / BLDSC - British Library D...
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interf...
A method that uses the data of ray tracing for optical waveguide lens diagnostics is described. This...
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-...
A new method for measuring waveguide propagation loss in silicon nanowires is presented. This method...
Communication technologies today are increasingly reliant on the manipulation of optical signals whe...
International audienceWe propose and demonstrate a nondestructive method for loss measurement in opt...
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant...