Coherent X-ray diffraction and X-ray Intensity Fluctuation Spectroscopy (XIFS) are ideal methods and techniques to perform measurements on the dynamics of fluctuations in condensed matter materials. To investigate more systems and faster fluctuations by being able to tune the coherence length, we use a zone plate to change the coherence length and beam size but keep most of the intensity. Using the zone plate, experiments were carried out to measure the properties of the focused beam. We applied a formalism to calculate the effect of optics on coherence. We tested our results by doing measurement at Advanced Photon Source. We measured the focal properties of the zone plate, speckle sizes and contrast, obtained by using coherent X-ray diffra...
In the last decades, the commissioning of high-energy, third-generation synchrotronspresents new opp...
International audienceThe upgraded ID01 beamline now offers a coherent X-ray probe, 56 nm x 141 nm i...
The photon density profile of an X-ray free-electron laser (XFEL) beam at the focal position is a cr...
X-ray radiation has been used to study structural properties of materials for morethan a hundred yea...
Coherence and interference phenomena are the fundamental properties of light. Synchrotrons andx-ray ...
X-rays have wavelengths comparable to typical interatomic spacings, which makes them useful for prob...
Les propriétés exceptionnelles des sources de rayonnement synchrotron ont été et sont de plus en plu...
© 2010 Dr. Samuel FlewettThe continued development of synchrotron sources, especially over the previ...
Note:We extended Intensity Fluctuation Spectroscopy (IFS) to atomic scale fluctuations using coheren...
The advent of highly-coherent x-ray light sources, such as those now available world-wide in modern ...
The longitudinal coherence function at the Advanced Photon Source beamline 34-ID-C has been measured...
Disordered matter undergoes fluctuations on a wide range of time and length scales – using the coher...
International audienceA detailed characterization of the coherent x-ray wavefront produced by a part...
The degree of spatial coherence, as basic characteristics of the radiation, becomes an important gui...
We show the results of speckle contrast analysis at the MID instrument of European XFEL in the hard ...
In the last decades, the commissioning of high-energy, third-generation synchrotronspresents new opp...
International audienceThe upgraded ID01 beamline now offers a coherent X-ray probe, 56 nm x 141 nm i...
The photon density profile of an X-ray free-electron laser (XFEL) beam at the focal position is a cr...
X-ray radiation has been used to study structural properties of materials for morethan a hundred yea...
Coherence and interference phenomena are the fundamental properties of light. Synchrotrons andx-ray ...
X-rays have wavelengths comparable to typical interatomic spacings, which makes them useful for prob...
Les propriétés exceptionnelles des sources de rayonnement synchrotron ont été et sont de plus en plu...
© 2010 Dr. Samuel FlewettThe continued development of synchrotron sources, especially over the previ...
Note:We extended Intensity Fluctuation Spectroscopy (IFS) to atomic scale fluctuations using coheren...
The advent of highly-coherent x-ray light sources, such as those now available world-wide in modern ...
The longitudinal coherence function at the Advanced Photon Source beamline 34-ID-C has been measured...
Disordered matter undergoes fluctuations on a wide range of time and length scales – using the coher...
International audienceA detailed characterization of the coherent x-ray wavefront produced by a part...
The degree of spatial coherence, as basic characteristics of the radiation, becomes an important gui...
We show the results of speckle contrast analysis at the MID instrument of European XFEL in the hard ...
In the last decades, the commissioning of high-energy, third-generation synchrotronspresents new opp...
International audienceThe upgraded ID01 beamline now offers a coherent X-ray probe, 56 nm x 141 nm i...
The photon density profile of an X-ray free-electron laser (XFEL) beam at the focal position is a cr...