Rutherford backscattering spectroscopy (RBS) and elastic recoil detection analysis (ERDA) with lithium ions are compared to using helium ions. The availability and accuracy of backscattering cross-section and stopping power data for incident Li ions are reviewed, and energy broadening contributions due to detector resolution and energy loss straggling are discussed. Theoretical calculations of the depth resolution are compared with experimental data for RBS from Nb/Co multilayers and foil-ERDA from amorphous hydrogenated carbon multilayers. In RBS about the same or better depth resolution with Li than with He is achieved, while in ERDA for the detection of hydrogen isotopes the depth resolution is increased by a factor of about 1.5 compared...
International audienceQuantitative depth profiling measurements of implanted light elements is an im...
The elastic scattering cross-sections for 6Li and 7Li ions backscattered from oxygen have been measu...
Backscattering spectrometry is the microanalysis of the surface and near−surface regions of material...
Rutherford backscattering spectroscopy (RBS) and elastic recoil detection analysis (ERDA) with lithi...
This paper presents the results of an experimental study of three samples containing various element...
The Rutherford backscattering spectroscopy (RBS) has been an important analytical method for determi...
Depth resolution and probing depth for Li in lithium thin film batteries achievable using different ...
Rutherford Backscattering Spectrometry (RBS) is a very popular, fast, and non-destructive technique ...
(ERDA) set-up is available at the high charge state injec-tor (HLI) of GSI and mainly used for desor...
Composition analyses for all of the elements in the periodic table can be performed through a combin...
The elastic scattering cross-sections for 6Li and 7Li ions backscattered from oxygen have been measu...
The stopping cross section, ε, of light ions in solids determines the accuracy of depth distribution...
Nanoelectronics relies more and more on novel materials and architectures for technology advancement...
Rutherford backscattering spectroscopy (RBS) is a non-destructive ion-beam analytical technique that...
The analysis of thin films is of central importance for functional materials, including the very lar...
International audienceQuantitative depth profiling measurements of implanted light elements is an im...
The elastic scattering cross-sections for 6Li and 7Li ions backscattered from oxygen have been measu...
Backscattering spectrometry is the microanalysis of the surface and near−surface regions of material...
Rutherford backscattering spectroscopy (RBS) and elastic recoil detection analysis (ERDA) with lithi...
This paper presents the results of an experimental study of three samples containing various element...
The Rutherford backscattering spectroscopy (RBS) has been an important analytical method for determi...
Depth resolution and probing depth for Li in lithium thin film batteries achievable using different ...
Rutherford Backscattering Spectrometry (RBS) is a very popular, fast, and non-destructive technique ...
(ERDA) set-up is available at the high charge state injec-tor (HLI) of GSI and mainly used for desor...
Composition analyses for all of the elements in the periodic table can be performed through a combin...
The elastic scattering cross-sections for 6Li and 7Li ions backscattered from oxygen have been measu...
The stopping cross section, ε, of light ions in solids determines the accuracy of depth distribution...
Nanoelectronics relies more and more on novel materials and architectures for technology advancement...
Rutherford backscattering spectroscopy (RBS) is a non-destructive ion-beam analytical technique that...
The analysis of thin films is of central importance for functional materials, including the very lar...
International audienceQuantitative depth profiling measurements of implanted light elements is an im...
The elastic scattering cross-sections for 6Li and 7Li ions backscattered from oxygen have been measu...
Backscattering spectrometry is the microanalysis of the surface and near−surface regions of material...