Optical Studies ofNano-Structures in the BeetleCetonia Aurata

The main objective of this thesis is to study the polarization effects of the beetle Cetonia aurata using Mueller-matrix ellipsometry. The outer shell of the beetle consists of complex microstructures which control the polarization of the reflected light. It has metallic appearance which originates from helicoidal structures. When these microstructures are exposed to polarized or unpolarized light, only left-handed circularly polarized light is reflected. Moreover, the exo-skeleton of the beetle absorbs right-handed polarized light. Multichannel Mueller-matrix ellipsometer or dual rotating compensator ellipsometer, called RC2, from J.A.Woollam is used to measure the polarization caused by different parts of beetle’s body. The 16 Mueller matrix elements are measured in the spectral range 400-800 nm at multiple angles of incidencein the range 400-700. An Optical model is developed to help us understand the nature and type of microstructure which only reflects the green colour circularly polarized light. With the help of multiparametric modeling, we were able to find optical properties and structural parameters. The parameters are: the number of layers, the numbers of sub-layers, their thicknesses, and the orientation with respect to optical axes. This optical model describes the nanostructures which provide the reflection properties similar to the nanostructure found in the beetle Cetonia aurata. The model is also useful for analysis of the optical response data of different materials with multilayer structures.