Copper-containing silica films were synthesized by radiofrequency (rf) co-sputtering deposition technique, and then heat-treated in different annealing atmospheres, i.e. either oxidizing or reducing, with the aim to develop suitable preparation methodologies for controlling the composite structure. Characterization of the samples along the various preparation steps was performed by Rutherford backscattering spectrometry (RBS), transmission electron microscopy and optical absorption spectroscopy. The nonlinear optical coefficient n2 of the nanocomposite films was estimated by the Z-scan technique. Experimental observations showed that copper migration and aggregation depend critically on the annealing conditions, giving rise to quite differe...