There the specialized Information-Measurement Systems (IMS) to study the characteristics of semiconductor devices are considered. The consistent series of simulatiors of measurement process, which determines the structurally-functional basis of IMS and allows to create the software of measurement by the language of high level, has been constructed. The design procedure of IMS of discrete semiconductor devices has been developed; on this basis the hardware and the software have been created and have been introduced at number of enterprises. The results are recommended for use in the Computer-Aided Process Systems of devices at the enterprises of electronic industryAvailable from VNTIC / VNTIC - Scientific & Technical Information Centre of Ru...
The work covers the measurement-computer systems (MCS) and their maximum possibilities. The aim is t...
The aim is to develop the structure of the specialized measurement-computer complex (MCC) of built-i...
The modeling of semiconductor device characteristics using unified table and analytical models for a...
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. Th...
The methods and algorithms for verification of the software-hardware structure in the board informat...
It is shown that computer systems for measuring current-voltage characteristics are very important f...
The work covers the measurement-computer systems (MCS) and physical-chemical check procedures. The a...
The investigation is concerned with high-frequency transistor transducers of electrical power for th...
M.Ing. (Electrical & Electronic Engineering)Measurement techniques and software were developed for t...
The methods of constructing technological software for design and adjustment of information-measurem...
The purpose of the work: the development of the scientifically justified recommendations of the prin...
The development of the theory, methods and bases of the measurement means design of periodical signa...
U završnom radu izrađena je razvojna pločica za ispitivanje karakteristika tranzistora. Opisane su k...
Theoretical part of the bachelor thesis describes ATE systems focused on electrical tests of semicon...
W pracy omówiono budowę i zasadę działania autorskiego systemu do automatycznego pomiaru parametrów ...
The work covers the measurement-computer systems (MCS) and their maximum possibilities. The aim is t...
The aim is to develop the structure of the specialized measurement-computer complex (MCC) of built-i...
The modeling of semiconductor device characteristics using unified table and analytical models for a...
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. Th...
The methods and algorithms for verification of the software-hardware structure in the board informat...
It is shown that computer systems for measuring current-voltage characteristics are very important f...
The work covers the measurement-computer systems (MCS) and physical-chemical check procedures. The a...
The investigation is concerned with high-frequency transistor transducers of electrical power for th...
M.Ing. (Electrical & Electronic Engineering)Measurement techniques and software were developed for t...
The methods of constructing technological software for design and adjustment of information-measurem...
The purpose of the work: the development of the scientifically justified recommendations of the prin...
The development of the theory, methods and bases of the measurement means design of periodical signa...
U završnom radu izrađena je razvojna pločica za ispitivanje karakteristika tranzistora. Opisane su k...
Theoretical part of the bachelor thesis describes ATE systems focused on electrical tests of semicon...
W pracy omówiono budowę i zasadę działania autorskiego systemu do automatycznego pomiaru parametrów ...
The work covers the measurement-computer systems (MCS) and their maximum possibilities. The aim is t...
The aim is to develop the structure of the specialized measurement-computer complex (MCC) of built-i...
The modeling of semiconductor device characteristics using unified table and analytical models for a...