Add to ORKGSemiconducting materials and barrier structures have been investigated in the paper. As a result quantitative models of the signal formation in local capacitive and current methods for the investigation of electric properties of semiconductor have been suggested. The new method for the determination of the diffusion length profile for non-main charge carriers in semiconductors has been developedAvailable from VNTIC / VNTIC - Scientific & Technical Information Centre of RussiaSIGLERURussian Federatio
The method is presented and computer tools of automated measurement of electrical parameters and exp...
Semiconductor electronic and optoelectronic devices such as transistors, lasers,modulators, and dete...
This thesis is focused on the study of charge transport in semiconductors. Monte Carlo simulation is...
Master´s thesis is focused on diagnostics of semiconductor materials by EBIC method (measuring of cu...
This work deals with fundamental properties of semiconductors materials and methods of their measuri...
We present a novel method for determining semiconductor parameters such as diffusion length L, lifet...
This thesis treats about semiconducting silicon structures. It describes the characteristics of the ...
The features of the current–voltage (I–V) measurements in local regions of semiconductor nanostructu...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
AbstractThe features of the current–voltage (I–V) measurements in local regions of semiconductor nan...
This thesis deals with the monitoring of physical parameters in semiconductor materials. The experim...
The aim is to investigate the anisotropic-resistive, galvano-magnetic and contact phenomena in the a...
The progress of electrical engineering and electronics has demanded the application of new materials...
The method is presented and computer tools of automated measurement of electrical parameters and exp...
Semiconductor electronic and optoelectronic devices such as transistors, lasers,modulators, and dete...
This thesis is focused on the study of charge transport in semiconductors. Monte Carlo simulation is...
Master´s thesis is focused on diagnostics of semiconductor materials by EBIC method (measuring of cu...
This work deals with fundamental properties of semiconductors materials and methods of their measuri...
We present a novel method for determining semiconductor parameters such as diffusion length L, lifet...
This thesis treats about semiconducting silicon structures. It describes the characteristics of the ...
The features of the current–voltage (I–V) measurements in local regions of semiconductor nanostructu...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
The accurate measure of semiconductor electrical properties is a fundamental step for the design and...
AbstractThe features of the current–voltage (I–V) measurements in local regions of semiconductor nan...
This thesis deals with the monitoring of physical parameters in semiconductor materials. The experim...
The aim is to investigate the anisotropic-resistive, galvano-magnetic and contact phenomena in the a...
The progress of electrical engineering and electronics has demanded the application of new materials...
The method is presented and computer tools of automated measurement of electrical parameters and exp...
Semiconductor electronic and optoelectronic devices such as transistors, lasers,modulators, and dete...
This thesis is focused on the study of charge transport in semiconductors. Monte Carlo simulation is...