SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T 56485 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
X-ray scattering has been used to study the structures of various semiconductor interfaces. Investi...
SIGLEINIST T 75824 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS TD Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLEINIST T 75769 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLET 55951 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T 57952 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
In this thesis the electronic and structural properties of the Au/Si and Pb/Si interfaces have been ...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX171335 / BLDSC - British Library D...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
In the last few years, a better understanding of the structural and electronic properties of surface...
In the last few years, a better understanding of the structural and electronic properties of surface...
The formation of the Cu/Si interface is described on the basis of joint photoemission (valence band ...
SIGLECNRS T 56485 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
X-ray scattering has been used to study the structures of various semiconductor interfaces. Investi...
SIGLEINIST T 75824 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS TD Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLEINIST T 75769 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLET 55951 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
SIGLECNRS T 57952 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
In this thesis the electronic and structural properties of the Au/Si and Pb/Si interfaces have been ...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX171335 / BLDSC - British Library D...
SIGLECNRS T Bordereau / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
In the last few years, a better understanding of the structural and electronic properties of surface...
In the last few years, a better understanding of the structural and electronic properties of surface...
The formation of the Cu/Si interface is described on the basis of joint photoemission (valence band ...
SIGLECNRS T 56485 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
X-ray scattering has been used to study the structures of various semiconductor interfaces. Investi...
SIGLEINIST T 75824 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc