Semiconductor industry is faced with ever shorter times to market accompanied by increasing complexity of IC's. Today's concepts to assure quality and reliability rely on testing at a late stage in product development. Such methods become more and more inefficient in terms of costs and time for development of new devices and circuits. Therefore a new methodology in Q and R accessment has to be developed and implemented. Efforts in this direction have been started by different players in semiconductor industry. The reason being that Q and R has become a major aspect of competetiveness and economical success. The project 'Smart Fabrications' is focussed on: failure analysis for Integrated Circuits with reduced feature sizes, highly efficient ...
Einige der Hauptanliegen modernen Halbleiterproduzenten sind die Verbesserung von QualitÃ$t, ZuverlÃ...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
In this research, the normal distribution is assumed to be the product characteristic, and the DITM ...
The partners within the research cooperation with the IC manufactures BOSCH, SIEMENS, TEMIC, THESYS ...
Effective Quality Management is a key factor for increasing economy and customer satisfication in th...
SIGLEAvailable from TIB Hannover: F99B1199 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Techni...
This work attempts to bridge the gap between manufacturability, quality, and reliability. The invest...
There the purposes are to develop and to introduce the structural and manufacturing methods of relia...
Heutige Produktentwicklungen sind durch zunehmend kürzere Entwicklungszeiten geprägt, in denen immer...
Die Arbeit zeigt neue Möglichkeiten bei der Bewältigung der vielfältigen Herausforderungen in der El...
High quality requests of products mean also the demand for constant material conditions fitting for ...
Dieser Band enthaelt 24 Vortraege und 9 Plakatbeitraege zum Themenkreis zerstoerungsfreie Werkstoffp...
This paper demonstrates the viability of wafer-level methods as a means of evaluating device reliabi...
Within the scope of the R and D-project 'Techniques of higher integration levels' the following acti...
Integrated electronic systems are increasingly used in an wide number of applications and environmen...
Einige der Hauptanliegen modernen Halbleiterproduzenten sind die Verbesserung von QualitÃ$t, ZuverlÃ...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
In this research, the normal distribution is assumed to be the product characteristic, and the DITM ...
The partners within the research cooperation with the IC manufactures BOSCH, SIEMENS, TEMIC, THESYS ...
Effective Quality Management is a key factor for increasing economy and customer satisfication in th...
SIGLEAvailable from TIB Hannover: F99B1199 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Techni...
This work attempts to bridge the gap between manufacturability, quality, and reliability. The invest...
There the purposes are to develop and to introduce the structural and manufacturing methods of relia...
Heutige Produktentwicklungen sind durch zunehmend kürzere Entwicklungszeiten geprägt, in denen immer...
Die Arbeit zeigt neue Möglichkeiten bei der Bewältigung der vielfältigen Herausforderungen in der El...
High quality requests of products mean also the demand for constant material conditions fitting for ...
Dieser Band enthaelt 24 Vortraege und 9 Plakatbeitraege zum Themenkreis zerstoerungsfreie Werkstoffp...
This paper demonstrates the viability of wafer-level methods as a means of evaluating device reliabi...
Within the scope of the R and D-project 'Techniques of higher integration levels' the following acti...
Integrated electronic systems are increasingly used in an wide number of applications and environmen...
Einige der Hauptanliegen modernen Halbleiterproduzenten sind die Verbesserung von QualitÃ$t, ZuverlÃ...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
In this research, the normal distribution is assumed to be the product characteristic, and the DITM ...