Hoechstaufloesende Elektronen-Spektro-Mikroskopie mit durchstimmbarer XUV-Strahlung

The SMART (SpectroMicroscope for All Relevant Techniques) spectromicroscopy project is commonly regarded the worldwide most ambitious research project in surface science dealing with high lateral spectroscopic resolution by combination of an aberration corrected electron microscope with high-brillance synchrotron radiation. Aberration correction of the objective lens using a magnetic beam spliter and a tetrode as well as the corrected imaging energy filter may allow spectroscopic information from areas as small as 5 nm for many different modes of operation. Within the first 3-years period the concept and construction of almost all major components has been completed, which may now be chracterized in detail. It is planned, that a simple version of the spectromicroscope (without aberration correction an energy filter) will be in operation at BESSY-II in spring 1999. Full operation of the complete instrument is scheduled for fall 2000. Within this project two more microspectroscopes were operated: the PISAM-II instrument has reached 600 nm resolution using an ellipsoidal mirror for refocusing, and the SpeLEEM (spectroscopic LEEM)+, operated by the Clausthal group at ELETTRA has reached 22 nm lateral resolution. Some test experiments have been performed with the SpeLEEM to evaluate the possibilities of such a multi-purpose instrument. (orig.)SIGLEAvailable from TIB Hannover: DtF QN1(66,18) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman