Plasma-Massenspektrometer Abschlussbericht

The trend in elemental analysis to better detection limits, as they are required in many areas (pure materials, semiconductor production, environmental analysis) has in recent years led to the wide-spread application of plasma mass spectrometry. With the actually used analyzers (quadropole mass filters) detection limits of a number of important elements are limited by molecular interferences of equal nominal mass as well as a high photon background. To overcome these limitations a mass spectrometric analyzer of high resolving power was developed, allowing separation of most of the interferences by high mass resolution. In spite of higher complexity it can as well be employed to routine analysis due to a high degree of automation. With a new analyzer concept it could be shown that fast routine measurements, user friendliness and high mass resolution can be combined in one instrument. Detection limits of some elements could be improved by several orders of magnitude compared to the commonly used instruments. The basic instrumental parameters were optimized and verified by a series of application measurements. The results were published at several international conferences. (orig.)Available from TIB Hannover: DtF QN1(27,50) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEBundesministerium fuer Forschung und Technologie (BMFT), Bonn (Germany)DEGerman