Electron microscopy of interfaces and thin buried layers in the InGaAs/InP system grown by MOVPE

High resolution electron microscopy of thin protein crystals

Bullough, P.A

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D60477 / BLDSC - British Library Doc...

Electron microscopy of CVD diamond films

Hetherington, A.V.

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:D197914 / BLDSC - British Library Doc...

Structure of the InP/SiO₂ interface

March 1995

Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Inst...

An electron microscopy study of some metal-semiconductor interfaces

Kiely, C.J

January 1986

SIGLEAvailable from British Library Document Supply Centre- DSC:D73305/87 / BLDSC - British Library ...

Transmission electron microscopy of GaAs/AlGaAs multilayers

Hetherington, C

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81542 / BLDSC - British Library Doc...

Electron tunnelling microscopy at free surfaces

Cockburn, J.W

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D60518 / BLDSC - British Library Doc...

Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems

Jackson, M.D.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010644 / BLDSC - British Library D...

Analysis of multilayer coatings by electron microscopy

Davock, H.J.

January 1998

Available from British Library Document Supply Centre-DSC:DXN046197 / BLDSC - British Library Docume...

The Characterisation of Defects in III-V Semiconducting Compounds by Electron Microscopy.

Dixon, Richard H.

January 1990

The two III-V semiconductor compound systems, InP/Ga0.47In0.53As and InxGa1-xAs/GaAs, were examined ...

Studies of interfacial structure in group III-V semiconductors by high resolution electron microscopy

Mallard, R

January 1989

SIGLEAvailable from British Library Document Supply Centre- DSC:D78366 / BLDSC - British Library Doc...

Electron microscope studies of the plastic deformation of GaAs and GaAlAs after indentation

Haswell, R

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:DX79460 / BLDSC - British Library Do...

An electron microscopy study of CulnSe_2

Mullan, C.A

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:DX183490 / BLDSC - British Library D...

The electron microscopy of silicon of sapphire materials

Paus, K

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:DX76985 / BLDSC - British Library Do...

Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Laczik, Z

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:D173848 / BLDSC - British Library Do...

Analytical electron microscopy of interfaces in cathodic arc coatings

MacKenzie, M.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010074 / BLDSC - British Library D...

High resolution electron microscopy of thin protein crystals

Bullough, P.A

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D60477 / BLDSC - British Library Doc...

Electron microscopy of CVD diamond films

Hetherington, A.V.

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:D197914 / BLDSC - British Library Doc...

Structure of the InP/SiO₂ interface

March 1995

Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Inst...

An electron microscopy study of some metal-semiconductor interfaces

Kiely, C.J

January 1986

SIGLEAvailable from British Library Document Supply Centre- DSC:D73305/87 / BLDSC - British Library ...

Transmission electron microscopy of GaAs/AlGaAs multilayers

Hetherington, C

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81542 / BLDSC - British Library Doc...

Electron tunnelling microscopy at free surfaces

Cockburn, J.W

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D60518 / BLDSC - British Library Doc...

Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems

Jackson, M.D.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010644 / BLDSC - British Library D...

Analysis of multilayer coatings by electron microscopy

Davock, H.J.

January 1998

Available from British Library Document Supply Centre-DSC:DXN046197 / BLDSC - British Library Docume...

The Characterisation of Defects in III-V Semiconducting Compounds by Electron Microscopy.

Dixon, Richard H.

January 1990

The two III-V semiconductor compound systems, InP/Ga0.47In0.53As and InxGa1-xAs/GaAs, were examined ...

Studies of interfacial structure in group III-V semiconductors by high resolution electron microscopy

Mallard, R

January 1989

SIGLEAvailable from British Library Document Supply Centre- DSC:D78366 / BLDSC - British Library Doc...

Electron microscope studies of the plastic deformation of GaAs and GaAlAs after indentation

Haswell, R

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:DX79460 / BLDSC - British Library Do...

An electron microscopy study of CulnSe_2

Mullan, C.A

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:DX183490 / BLDSC - British Library D...

The electron microscopy of silicon of sapphire materials

Paus, K

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:DX76985 / BLDSC - British Library Do...

Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Laczik, Z

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:D173848 / BLDSC - British Library Do...

Analytical electron microscopy of interfaces in cathodic arc coatings

MacKenzie, M.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010074 / BLDSC - British Library D...

High resolution electron microscopy of thin protein crystals

Bullough, P.A

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D60477 / BLDSC - British Library Doc...

Electron microscopy of CVD diamond films

Hetherington, A.V.

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:D197914 / BLDSC - British Library Doc...

Structure of the InP/SiO₂ interface

March 1995

Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Inst...

Electron microscopy of interfaces and thin buried layers in the InGaAs/InP system grown by MOVPE

Abstract

Extracted data

Electron microscopy of interfaces and thin buried layers in the InGaAs/InP system grown by MOVPE

Abstract

Extracted data

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