Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements

High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

Toh, S.L.
Li, K.
Ang, C.H.
Er, E.
Redkar, S.
Loh, K.P.
Boothroyd, C.B.
Chan, L.

January 2004

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circui...

Determination of the properties of plastics at high strain rates

Dean, G.
Mera, R.
Arranz, E.
National Physical Lab., Teddington (United Kingdom)

January 2002

SIGLEAvailable from British Library Document Supply Centre-DSC:6180.5139(116) / BLDSC - British Libr...

The measurement and interpretation of small strain stiffness of soils

Jovicic, V.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN012947 / BLDSC - British Library D...

Strain relaxation in semiconductor devices

Downes, J.R

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN006075 / BLDSC - British Library D...

Measurement of small strains using semiconductors in centrifuge tests

Ng, C.W
Cambridge Univ. (United Kingdom). Dept. of Engineering

January 1995

SIGLEAvailable from British Library Document Supply Centre- DSC:9106.17(CUED/D-SOILS/TR--282) / BLDS...

Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements.

Harvey, Alan John.

June 2018

A technique has been developed for the strain analysis of strained layer heterostructures using a co...

Strain relaxation in semiconductor heterostructures

Colson, H.G.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN012888 / BLDSC - British Library D...

Strain effects in semiconductor quantum wells

Wood, A

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:D172561 / BLDSC - British Library Do...

Near surface strain measurements on quartz wafers and devices

Broughton, W.R.
National Physical Laboratory (Great Britain) (United Kingdom)

January 2003

Includes bibliographical referencesAvailable from British Library Document Supply Centre- DSC:5413. ...

Advanced strain measurement techniques for monitoring full scale structures

Begg, D.W
Council for National Academic Awards, London (United Kingdom)

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:DX173643 / BLDSC - British Library D...

Thin film strain gauging of engineering components

Gray, D.
Wood, M.
Lamb, P
ERA Technology Ltd., Leatherhead (United Kingdom)

January 1992

Final reportAvailable from British Library Document Supply Centre-DSC:3794.870(ERA--92-0726) / BLDSC...

Applications of optical strain-measurement techniques to composite materials

Goldrein, H.T.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:D195584 / BLDSC - British Library Doc...

The determination of strain distributions in forgings

Oyekanmi, B.O

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D84852 / BLDSC - British Library Doc...

Quantitative acoustic measurements of strained and layered semiconductor materials

Stoodley, N

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:D185315 / BLDSC - British Library Do...

Strain measurement using neutron diffraction

Wang, D.Q.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN008696 / BLDSC - British Library D...

High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

Toh, S.L.
Li, K.
Ang, C.H.
Er, E.
Redkar, S.
Loh, K.P.
Boothroyd, C.B.
Chan, L.

January 2004

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circui...

Determination of the properties of plastics at high strain rates

Dean, G.
Mera, R.
Arranz, E.
National Physical Lab., Teddington (United Kingdom)

January 2002

SIGLEAvailable from British Library Document Supply Centre-DSC:6180.5139(116) / BLDSC - British Libr...

The measurement and interpretation of small strain stiffness of soils

Jovicic, V.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN012947 / BLDSC - British Library D...

Strain relaxation in semiconductor devices

Downes, J.R

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN006075 / BLDSC - British Library D...

Measurement of small strains using semiconductors in centrifuge tests

Ng, C.W
Cambridge Univ. (United Kingdom). Dept. of Engineering

January 1995

SIGLEAvailable from British Library Document Supply Centre- DSC:9106.17(CUED/D-SOILS/TR--282) / BLDS...

Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements.

Harvey, Alan John.

June 2018

A technique has been developed for the strain analysis of strained layer heterostructures using a co...

Strain relaxation in semiconductor heterostructures

Colson, H.G.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN012888 / BLDSC - British Library D...

Strain effects in semiconductor quantum wells

Wood, A

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:D172561 / BLDSC - British Library Do...

Near surface strain measurements on quartz wafers and devices

Broughton, W.R.
National Physical Laboratory (Great Britain) (United Kingdom)

January 2003

Includes bibliographical referencesAvailable from British Library Document Supply Centre- DSC:5413. ...

Advanced strain measurement techniques for monitoring full scale structures

Begg, D.W
Council for National Academic Awards, London (United Kingdom)

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:DX173643 / BLDSC - British Library D...

Thin film strain gauging of engineering components

Gray, D.
Wood, M.
Lamb, P
ERA Technology Ltd., Leatherhead (United Kingdom)

January 1992

Final reportAvailable from British Library Document Supply Centre-DSC:3794.870(ERA--92-0726) / BLDSC...

Applications of optical strain-measurement techniques to composite materials

Goldrein, H.T.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:D195584 / BLDSC - British Library Doc...

The determination of strain distributions in forgings

Oyekanmi, B.O

January 1988

SIGLEAvailable from British Library Document Supply Centre- DSC:D84852 / BLDSC - British Library Doc...

Quantitative acoustic measurements of strained and layered semiconductor materials

Stoodley, N

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:D185315 / BLDSC - British Library Do...

Strain measurement using neutron diffraction

Wang, D.Q.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN008696 / BLDSC - British Library D...

High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED

Toh, S.L.
Li, K.
Ang, C.H.
Er, E.
Redkar, S.
Loh, K.P.
Boothroyd, C.B.
Chan, L.

January 2004

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circui...

Determination of the properties of plastics at high strain rates

Dean, G.
Mera, R.
Arranz, E.
National Physical Lab., Teddington (United Kingdom)

January 2002

SIGLEAvailable from British Library Document Supply Centre-DSC:6180.5139(116) / BLDSC - British Libr...

The measurement and interpretation of small strain stiffness of soils

Jovicic, V.

January 1997

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN012947 / BLDSC - British Library D...

Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements

Abstract

Extracted data

Strain evaluation in III-V semiconductor compounds from measurement of thickness fringe displacements

Abstract

Extracted data

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