Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Electron microscope studies of the plastic deformation of GaAs and GaAlAs after indentation

Haswell, R

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:DX79460 / BLDSC - British Library Do...

The electron microscopy of silicon of sapphire materials

Paus, K

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:DX76985 / BLDSC - British Library Do...

Scanning tunnelling microscopy - imaging processes and the surface atomic structure of semiconductors

Todd, J.D

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:D93097 / BLDSC - British Library Doc...

Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems

Jackson, M.D.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010644 / BLDSC - British Library D...

A scanning optical microscope study of semiconductors

Holland, A.J

January 1994

SIGLEAvailable from British Library Document Supply Centre-DSC:D190915 / BLDSC - British Library Doc...

Infra-red studies on indium phosphide and related semiconductors

Reeder, A

January 1985

SIGLEAvailable from British Library Document Supply Centre- DSC:D65558/86 / BLDSC - British Library ...

S.T.E.M. analysis of nanometre scale inhomogeneities in semiconductors

Bullock, J

January 1988

STEM - Scanning Transmission Electron MicroscopeAvailable from British Library Document Supply Centr...

An electron microscopy study of some metal-semiconductor interfaces

Kiely, C.J

January 1986

SIGLEAvailable from British Library Document Supply Centre- DSC:D73305/87 / BLDSC - British Library ...

Transmission electron microscope structural studies of Si, SiGe and SiC materials and devices

Whitehurst, J

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:D170707 / BLDSC - British Library Do...

Scanning optical microscopy of semiconductor devices

McCabe, E

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81586 / BLDSC - British Library Doc...

Scanning tunnelling microscopy of Si(111), Pb-Si(111) and Si(113)

Hadley, M

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:DX173188 / BLDSC - British Library D...

Transmission electron microscopy of GaAs/AlGaAs multilayers

Hetherington, C

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81542 / BLDSC - British Library Doc...

Electron microscopy and luminescence study of defects in semiconductor silicon

Johnson, F.J

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:DX94101 / BLDSC - British Library Do...

Infra-red optical properties of SiGe/Si heterostructures

Corbin, E.A

January 1995

SIGLEAvailable from British Library Document Supply Centre- DSC:DX188308 / BLDSC - British Library D...

Scanning tunnelling microscopy of metal reactions with silicon

Gray, S.M

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:D062315 / BLDSC - British Library Do...

Electron microscope studies of the plastic deformation of GaAs and GaAlAs after indentation

Haswell, R

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:DX79460 / BLDSC - British Library Do...

The electron microscopy of silicon of sapphire materials

Paus, K

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:DX76985 / BLDSC - British Library Do...

Scanning tunnelling microscopy - imaging processes and the surface atomic structure of semiconductors

Todd, J.D

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:D93097 / BLDSC - British Library Doc...

Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems

Jackson, M.D.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN010644 / BLDSC - British Library D...

A scanning optical microscope study of semiconductors

Holland, A.J

January 1994

SIGLEAvailable from British Library Document Supply Centre-DSC:D190915 / BLDSC - British Library Doc...

Infra-red studies on indium phosphide and related semiconductors

Reeder, A

January 1985

SIGLEAvailable from British Library Document Supply Centre- DSC:D65558/86 / BLDSC - British Library ...

S.T.E.M. analysis of nanometre scale inhomogeneities in semiconductors

Bullock, J

January 1988

STEM - Scanning Transmission Electron MicroscopeAvailable from British Library Document Supply Centr...

An electron microscopy study of some metal-semiconductor interfaces

Kiely, C.J

January 1986

SIGLEAvailable from British Library Document Supply Centre- DSC:D73305/87 / BLDSC - British Library ...

Transmission electron microscope structural studies of Si, SiGe and SiC materials and devices

Whitehurst, J

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:D170707 / BLDSC - British Library Do...

Scanning optical microscopy of semiconductor devices

McCabe, E

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81586 / BLDSC - British Library Doc...

Scanning tunnelling microscopy of Si(111), Pb-Si(111) and Si(113)

Hadley, M

January 1992

SIGLEAvailable from British Library Document Supply Centre- DSC:DX173188 / BLDSC - British Library D...

Transmission electron microscopy of GaAs/AlGaAs multilayers

Hetherington, C

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:D81542 / BLDSC - British Library Doc...

Electron microscopy and luminescence study of defects in semiconductor silicon

Johnson, F.J

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:DX94101 / BLDSC - British Library Do...

Infra-red optical properties of SiGe/Si heterostructures

Corbin, E.A

January 1995

SIGLEAvailable from British Library Document Supply Centre- DSC:DX188308 / BLDSC - British Library D...

Scanning tunnelling microscopy of metal reactions with silicon

Gray, S.M

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:D062315 / BLDSC - British Library Do...

Electron microscope studies of the plastic deformation of GaAs and GaAlAs after indentation

Haswell, R

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:DX79460 / BLDSC - British Library Do...

The electron microscopy of silicon of sapphire materials

Paus, K

January 1987

SIGLEAvailable from British Library Document Supply Centre- DSC:DX76985 / BLDSC - British Library Do...

Scanning tunnelling microscopy - imaging processes and the surface atomic structure of semiconductors

Todd, J.D

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:D93097 / BLDSC - British Library Doc...

Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Abstract

Extracted data

Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

Abstract

Extracted data

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