The investigation of solid surfaces using optical probes Reflectance anisotropy spectroscopy

Coherent optical detection techniques in surface metrology

Holmes, R

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:DX189119 / BLDSC - British Library Do...

Study on in-plane optical anisotropy of semiconductor materials by reflectance difference spectroscopy

Zhao L (Zhao Lei)
Chen YH (Chen Yong-hai)
Zuo YH (Zuo Yu-hua)
Wang HN (Wang Hai-ning)
Shi WH (Shi Wen-hua)
Zhao, L, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.

January 2006

In the present review, the measuring principle of reflectance difference spectroscopy (RDS) is given...

Modelling surface reflectance for the simulation of remotely sensed data

Banks, A.

January 2000

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN038337 / BLDSC - British Library D...

The anisotropic reflectivity technique

Booth, D

January 1982

Available from British Library Document Supply Centre- DSC:D44305/83 / BLDSC - British Library Docum...

Measurement of profiled surfaces using polarising optical interferometry

Barman, S.A.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN017943 / BLDSC - British Library D...

Study of ellipsometric applications and examination of optical anisotrophy in aluminium and silicon oxides

Yaghmour, S.J

January 1985

SIGLEAvailable from British Library Lending Division - LD:D65713/86 / BLDSC - British Library Docume...

Infrared spectroscopy of surfaces

Fox, S.G

January 1989

SIGLEAvailable from British Library Document Supply Centre- DSC:DX92078 / BLDSC - British Library Do...

Optical spectroscopy of novel materials

Bowmar, P

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:D185202 / BLDSC - British Library Do...

Application of optical techniques to moving surface measurements

Stewart, J.N

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:DX92492 / BLDSC - British Library Do...

Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces

Chiaradia, P
Del Sole, R

January 1999

The development and the state of the art of surface methods based on the reflection of light are bri...

Aspects of reflectance anisotropy spectroscopy from semiconductor surfaces

Sobiesierski, Zbigniew
Westwood, David I.
Matthai, Clarence Cherian

January 1998

There currently exists a wide range of powerful techniques for probing surfaces, mainly involving th...

Surface analysis of solutions using photoelectron spectroscopy

Inchley, A.J

January 1988

Available from British Library Document Supply Centre- DSC:D85974 / BLDSC - British Library Document...

Nanoscale surface modification studied by reflection anisotropy spectroscopy

Cole, Jamie
Blackford, Jane
Lane, Paul David

January 2009

The development and control of nanoscale properties is a major goal in science and technology; for t...

An investigation on the optical properties of crystals by polarimetry

Renshaw, A

January 1990

SIGLEAvailable from British Library Document Supply Centre-DSC:D191546 / BLDSC - British Library Doc...

Novel probes for surface texture metrology

Haycocks, J.A
National Physical Lab., Teddington (United Kingdom). Div. of Mechanical and Optical Meteorology

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:6029.335(NPL-MOM--105) / BLDSC - Bri...

Coherent optical detection techniques in surface metrology

Holmes, R

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:DX189119 / BLDSC - British Library Do...

Study on in-plane optical anisotropy of semiconductor materials by reflectance difference spectroscopy

Zhao L (Zhao Lei)
Chen YH (Chen Yong-hai)
Zuo YH (Zuo Yu-hua)
Wang HN (Wang Hai-ning)
Shi WH (Shi Wen-hua)
Zhao, L, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.

January 2006

In the present review, the measuring principle of reflectance difference spectroscopy (RDS) is given...

Modelling surface reflectance for the simulation of remotely sensed data

Banks, A.

January 2000

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN038337 / BLDSC - British Library D...

The anisotropic reflectivity technique

Booth, D

January 1982

Available from British Library Document Supply Centre- DSC:D44305/83 / BLDSC - British Library Docum...

Measurement of profiled surfaces using polarising optical interferometry

Barman, S.A.

January 1996

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN017943 / BLDSC - British Library D...

Study of ellipsometric applications and examination of optical anisotrophy in aluminium and silicon oxides

Yaghmour, S.J

January 1985

SIGLEAvailable from British Library Lending Division - LD:D65713/86 / BLDSC - British Library Docume...

Infrared spectroscopy of surfaces

Fox, S.G

January 1989

SIGLEAvailable from British Library Document Supply Centre- DSC:DX92078 / BLDSC - British Library Do...

Optical spectroscopy of novel materials

Bowmar, P

January 1994

SIGLEAvailable from British Library Document Supply Centre- DSC:D185202 / BLDSC - British Library Do...

Application of optical techniques to moving surface measurements

Stewart, J.N

January 1990

SIGLEAvailable from British Library Document Supply Centre- DSC:DX92492 / BLDSC - British Library Do...

Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces

Chiaradia, P
Del Sole, R

January 1999

The development and the state of the art of surface methods based on the reflection of light are bri...

Aspects of reflectance anisotropy spectroscopy from semiconductor surfaces

Sobiesierski, Zbigniew
Westwood, David I.
Matthai, Clarence Cherian

January 1998

There currently exists a wide range of powerful techniques for probing surfaces, mainly involving th...

Surface analysis of solutions using photoelectron spectroscopy

Inchley, A.J

January 1988

Available from British Library Document Supply Centre- DSC:D85974 / BLDSC - British Library Document...

Nanoscale surface modification studied by reflection anisotropy spectroscopy

Cole, Jamie
Blackford, Jane
Lane, Paul David

January 2009

The development and control of nanoscale properties is a major goal in science and technology; for t...

An investigation on the optical properties of crystals by polarimetry

Renshaw, A

January 1990

SIGLEAvailable from British Library Document Supply Centre-DSC:D191546 / BLDSC - British Library Doc...

Novel probes for surface texture metrology

Haycocks, J.A
National Physical Lab., Teddington (United Kingdom). Div. of Mechanical and Optical Meteorology

January 1991

SIGLEAvailable from British Library Document Supply Centre- DSC:6029.335(NPL-MOM--105) / BLDSC - Bri...

Coherent optical detection techniques in surface metrology

Holmes, R

January 1995

SIGLEAvailable from British Library Document Supply Centre-DSC:DX189119 / BLDSC - British Library Do...

Study on in-plane optical anisotropy of semiconductor materials by reflectance difference spectroscopy

Zhao L (Zhao Lei)
Chen YH (Chen Yong-hai)
Zuo YH (Zuo Yu-hua)
Wang HN (Wang Hai-ning)
Shi WH (Shi Wen-hua)
Zhao, L, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.

January 2006

In the present review, the measuring principle of reflectance difference spectroscopy (RDS) is given...

Modelling surface reflectance for the simulation of remotely sensed data

Banks, A.

January 2000

SIGLEAvailable from British Library Document Supply Centre-DSC:DXN038337 / BLDSC - British Library D...

The investigation of solid surfaces using optical probes Reflectance anisotropy spectroscopy

Abstract

Extracted data

The investigation of solid surfaces using optical probes Reflectance anisotropy spectroscopy

Abstract

Extracted data

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